2013 IEEE 14th International Superconductive Electronics Conference (ISEC) 2013
DOI: 10.1109/isec.2013.6604315
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Growth and characterization of Nb films and Nb/Al-AlO<inf>x</inf>/Nb trilayers for Josephson junctions

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“…Sputter-deposited columnar thin films have been shown to have small variations in grain orientation from the mean value [48,49]. Here, a maximum grain misorientation of q D =  2.5 is assumed such that each grain is randomly assigned a value between   1.25 from the mean direction.…”
Section: Grain Boundary Barriermentioning
confidence: 99%
“…Sputter-deposited columnar thin films have been shown to have small variations in grain orientation from the mean value [48,49]. Here, a maximum grain misorientation of q D =  2.5 is assumed such that each grain is randomly assigned a value between   1.25 from the mean direction.…”
Section: Grain Boundary Barriermentioning
confidence: 99%