2009
DOI: 10.1016/j.vacuum.2009.01.004
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Growth and characterization of electrosynthesized iron selenide thin films

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Cited by 92 publications
(63 citation statements)
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“…This is attributed to the decrease in film thickness at higher substrate temperatures which in turn decreases the crystalline component. 25 …”
Section: X-ray Diffraction Studiesmentioning
confidence: 99%
“…This is attributed to the decrease in film thickness at higher substrate temperatures which in turn decreases the crystalline component. 25 …”
Section: X-ray Diffraction Studiesmentioning
confidence: 99%
“…Thin films of binary 1:1 iron selenides and tellurides FeCh (Ch = Se, Te) were extensively studied since the early 1970s. Optical, magnetic and others physical properties were investigated [1][2][3][4][5][6][7], but resistivity has not been studied at temperatures below 100 K, and thus the occurrence of superconductivity was not recognized. This was probably due to the presence of iron that was historically considered detrimental for superconductivity.…”
Section: Introductionmentioning
confidence: 99%
“…Lee et al proposed that the introduction of STO or BaTiO 3 (BTO) thin buffer layers on LAO and LSAT substrates was effective for improving the film quality [53]. The Co-doped Ba122 films on these buffer layers showed a sharp superconducting transition (T onset c ≈ 22.8 K, T zero c ≈ 21.5 K, ∆T c ≈ 1.3 K), and the self-field critical current density, J c , was as high as 4.5 MA/cm 2 at 4.2 K. Iida et al found another useful buffer layer, that is, metal iron with a body-centered-cubic (bcc) structure whose bond length along [110] direction was close to that along [100] direction of Ba122 [54][55][56]. Indeed, by introducing the bcc-Fe buffer layer with thickness of ∼15 nm, the obtained values of T c for Co-doped Ba122 films on LSAT and MgO substrates increased by ∼2-4 K compared to those of films on bare these substrates.…”
Section: -Systemmentioning
confidence: 99%
“…There are also attempts to grow FeSe films by electrochemical techniques [109][110][111][112][113][114] and chemical vapor deposition techniques [115,116]. However, T zero c comparable to that of bulk samples has not been obtained or the resistivity was not measured in these films.…”
Section: -Systemmentioning
confidence: 99%