2001
DOI: 10.1016/s0022-0248(01)00752-7
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Growth and characterisation of l-cystine doped TGS crystals

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Cited by 33 publications
(30 citation statements)
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“…However, only one report is available in which the doping of L-arginine in KDP was done (Kumaresan et al 2004) and the SHG efficiency is reported to be increased by doping of L-arginine. Moreover, the effect of doping of amino acids, L-tyrosine (Meera et al 2001), and L-lysine (Mohan Kumar et al 2001), in TGS crystals has been investigated. Figures 2-4 show the powder XRD patterns of pure KDP, 0⋅3% L-arginine doped KDP crystals and 0⋅4% Larginine doped KDP crystals, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…However, only one report is available in which the doping of L-arginine in KDP was done (Kumaresan et al 2004) and the SHG efficiency is reported to be increased by doping of L-arginine. Moreover, the effect of doping of amino acids, L-tyrosine (Meera et al 2001), and L-lysine (Mohan Kumar et al 2001), in TGS crystals has been investigated. Figures 2-4 show the powder XRD patterns of pure KDP, 0⋅3% L-arginine doped KDP crystals and 0⋅4% Larginine doped KDP crystals, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…All ferroelectric materials are pyro electric, however, not all pyro electric materials are ferroelectric. Below Curie temperature, ferroelectric and pyro electric materials are polar and possess a spontaneous polarization or electric dipole moment [4][5][6][7]. However, this polarity can be reoriented or reversed fully or partially through the application of an electric field with ferroelectric materials.…”
Section: Introductionmentioning
confidence: 99%
“…HRXRD results of pure TGS crystals have not been reported earlier. However, 18 arc sec has been reported for L-cystein doped [16] and 16 arc sec for L-tyrosine doped TGS crystal [17]. It may be mentioned here that such low angle boundaries could be detected with well-resolved peaks in the diffraction curve only because of the high-resolution of the multicrystal X-ray diffractometer used in the present studies.…”
Section: High Resolution X-ray Diffractometry Anlaysismentioning
confidence: 51%