“…Atomic (AFM) is an excellent and unique approach for observing crystal growth dynamics, imaging and measuring surface features as well as studying defect formations on a nanometer scale [11 (including its Refs. [5][6][7][8][9][10][11][12][13][14][15][16][17][18]), 12,13]. In this work, we have observed the crystal growth morphology of the {1 0 0} faces of the Cu 2+ -doped LAP crystals.…”