“…), Knoth and Schmid 24 (AR processes), and by Schipper and Schmid 25 (GARCH processes). EWMA control charts have also been used for monitoring attribute processes, see Gan 26 (binomial counts), Yeh et al 16 (binomial, Bernoulli, and geometric counts), Spliid 17 (geometric counts), Weiß 27 (Markov binomial counts), Gan 28 and Borror et al 29 (Poisson counts), Weiß 30,31 (Poisson INAR(1) processes), or Steiner 32 (k-grouped data). A basic EWMA chart for monitoring serially independent binary processes is proposed in Section 2, where we also investigate its average run length (ARL) performance.…”