“…Catalysts were previously characterized by adsorption of N 2 at −196 • C on a Micromeritics Tristar 3000 Apparatus, Micromeritics Instrument Corporation (Norcross, GA, USA), X-ray diffraction (XRD) on a Philips XPert PRO diffractometer (Amsterdam, Netherlands), X-ray photoelectron spectroscopy (XPS), on a ESCALAB 200A, VG Scientific (Waltham, MA, USA), energy-dispersive X-ray spectroscopy (EDX), transmission electron microscopy (TEM), as well as scanning transmission electron microscopy-high angle annular dark field (STEM-HAADF) using one single microscope (JEOL JEM-2100F, JEOL Ltd., Tokyo, Japan), temperature programmed reduction (H 2 -TPR) on a ChemiSorb 2750, (Micromeritics Instrument Corporation, Norcross, GA, USA) [38,39,42], and diffuse reflectance Fourier transform infrared (DRIFT) spectra of adsorbed CO [43] on a Bruker EQUINOX 55/S FTIR spectrometer (Billerica, MA, USA).…”