2021 Conference on Lasers and Electro-Optics Europe &Amp; European Quantum Electronics Conference (CLEO/Europe-EQEC) 2021
DOI: 10.1109/cleo/europe-eqec52157.2021.9542020
|View full text |Cite
|
Sign up to set email alerts
|

Graphene/Bi2Se3 Heterojunction Phototransistor Using Photogating Effect Modulated by Tunable Tunneling Resistance

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2021
2021
2021
2021

Publication Types

Select...
1

Relationship

1
0

Authors

Journals

citations
Cited by 1 publication
(4 citation statements)
references
References 6 publications
0
4
0
Order By: Relevance
“…Although the formation of the native oxidation layer is very fast at the initial stage after exfoliation, , its thickness is known to saturate since the oxidation process is significantly delayed over time due to the interplay between surface exposure and oxygen incorporation . The thickness of the oxidation layer is estimated as ∼2 nm (±0.2 nm). ,, …”
Section: Resultsmentioning
confidence: 99%
See 3 more Smart Citations
“…Although the formation of the native oxidation layer is very fast at the initial stage after exfoliation, , its thickness is known to saturate since the oxidation process is significantly delayed over time due to the interplay between surface exposure and oxygen incorporation . The thickness of the oxidation layer is estimated as ∼2 nm (±0.2 nm). ,, …”
Section: Resultsmentioning
confidence: 99%
“…Each step represents the transition point, where the transport mechanism changes and the resistance state switches to different resistance states. The oxidation layer naturally formed on the Bi 2 Se 3 surface is known to act as a tunneling barrier in contact with graphene. ,, The tunneling resistance is closely related to the potential barrier at the interface and the electronic density of states in graphene and Bi 2 Se 3 . Hence, the shape deformation of the asymmetric tunneling barrier will have a great influence on the tunneling current across the interface.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations