1995
DOI: 10.1007/bf00203983
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Grain boundary structures in silicon carbide: Verification of the extended boundary concept

Abstract: Abstract.A grain boundary layer of ca. 0.5 nm in thickness is present in B + C added SiC and SiC without any sintering aids. Since these materials do not show a significant strength-decrease at high temperatures, Ikuhara et al. presumed that the layer is not a second phase of sintering aids or impurities but a reconstructed structure formed to reduce the high energy of the grain boundary, and they called such a boundary an extended boundary. The concept of the extended boundary, however, has not yet been gener… Show more

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Cited by 16 publications
(3 citation statements)
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“…Identification of GB atoms is not unique and the centrosymmetry analysis provides an approximate upper bound for GB thickness. Typical experimental values of GB thickness of SiC range from 0.5 to 3 nm . Figure shows the nc‐SiC sample along with the grain size distribution.…”
Section: Methodsmentioning
confidence: 99%
“…Identification of GB atoms is not unique and the centrosymmetry analysis provides an approximate upper bound for GB thickness. Typical experimental values of GB thickness of SiC range from 0.5 to 3 nm . Figure shows the nc‐SiC sample along with the grain size distribution.…”
Section: Methodsmentioning
confidence: 99%
“…However, the arrows stop ϳ0.3-0.5 nm before they intersect observed disordered structure at the interface is thought to provide an easy diffusion path during sintering, and the densithe interface, suggesting the presence of an extended grain boundary, as observed in sintered, BϩC-doped SiC. 37 This fication of pure OHAp is believed to be governed by grainboundary diffusion. Studying the influence of the initial particle means that commonly, at least in this low-temperature-sintered OHAp material, no interface was found where both adjacent size on the densification rate yielded that grain-boundary diffusion is the limiting factor for OHAp densification.…”
Section: (1) Convergent-beam Electron Diffraction (Cbed) Studiesmentioning
confidence: 95%
“…SiC that has been doped with boron and carbon (B,C-SiC) and fabricated using solid-phase sintering 15 is known to have no intergranular glassy phase. [16][17][18] However, fabrication of a nanocrystalline SiC via solid-phase sintering is difficult, because solid-phase sintering requires a higher sintering temperature than does liquid-phase sintering. To fabricate a nanocrystalline SiC, we must keep the sintering temperature as low as possible and inhibit grain growth during sintering.…”
Section: Introductionmentioning
confidence: 99%