2020
DOI: 10.1117/1.jmm.19.3.033201
|View full text |Cite
|
Sign up to set email alerts
|

Gradient-based source mask and polarization optimization with the hybrid Hopkins–Abbe model

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…Thus, the threshold and the sigmoid functions can be employed to approximately represent the layout pattern after the resist effect is exerted on the wafer surface [23], [24]. Regarding the application of the gradient-based SO method, many studies have proven that the imaging performance of lithography can be improved by optimizing the source's intensity distribution [18], [25]. Peng et al employed a graylevel pixel to represent the lithographic source and utilized the gradient-based SO method to improve the image fidelity and depth of focus [18].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Thus, the threshold and the sigmoid functions can be employed to approximately represent the layout pattern after the resist effect is exerted on the wafer surface [23], [24]. Regarding the application of the gradient-based SO method, many studies have proven that the imaging performance of lithography can be improved by optimizing the source's intensity distribution [18], [25]. Peng et al employed a graylevel pixel to represent the lithographic source and utilized the gradient-based SO method to improve the image fidelity and depth of focus [18].…”
Section: Introductionmentioning
confidence: 99%
“…Peng et al employed a graylevel pixel to represent the lithographic source and utilized the gradient-based SO method to improve the image fidelity and depth of focus [18]. Ding et al employed the gradientdescent method to optimize the lithographic source and mask in the hybrid Hopkins-Abbe imaging model to enhance the optimization performance [25]. However, for a lithographic imaging process using a complicated resist model, it is not recommended to calculate the gradients of a highly complex merit function in the gradient-based SO model.…”
Section: Introductionmentioning
confidence: 99%