Glass Transition of Polymers with Different Architectures in the Confinement of Nanoscopic Films

Erber, Michael; Treß, Martin; Bittrich, Eva; Bittrich, Lars; Eichhorn, Klaus‐Jochen

doi:10.1007/978-3-319-75895-4_5

Cited by 3 publications

(14 citation statements)

References 56 publications

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“…The reduction of the glass transition temperature when the thickness of the film decreases is reported in many scientific articles; see, e.g., the review by Erber et al 40 and ref ( 42 ). However, there is evidence that very thin polymer films can also have an increased T g value than the corresponding bulk materials due to interaction with substrate.…”

Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 88%

“…Quite recently, Erber at al. 40 used the analytically integrated form of eq 19 to describe the dependence of the layer thickness on temperature:…”

Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 99%

“… 42 , 102 Over 20 years of research on the effects of geometric confinement of polymeric films did not lead to unequivocal results. 40 , 42 , 91 , 92 , 157 There are a large number of scientific works reporting that the glass transition temperature of thin polymer films differs significantly from the bulk value, T g,bulk . 29 , 34 , 35 , 42 − 44 , 84 − 87 , 126 , 137 , 158 , 168 , 169 However, the interpretation of these results is not unambiguous and is often controversial.…”

Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 99%

“… 184 It is clear that the controversies mentioned above relate to the thickness of the polymer film, for which the influence of surface layers begins to be significant. Erber et al 40 noticed that most robust results suggest that T g deviations occur below 15 nm film thicknesses and can be assigned to interfacial interactions. Figure 18 presents results from refs ( 40 , 71 , and 116 ), showing the T g deviation from the bulk value, T g,bulk , for thin PS films, deposited on different substrates.…”

Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 99%

“…Among the various experimental methods suitable for studying the thermo-optical properties of thin polymer films, temperature-dependent spectroscopic ellipsometry plays a special role. 40 A recent review by Erber et al 40 concerning the determination of the glass transition of polymers in nanoscopic films takes into account the role of the substrate, interfaces, and their dimensional confinement. The authors discussed the influence of polymer film thickness, i.e., the confinement effect, on T g .…”

Section: Introductionmentioning

confidence: 99%

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Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films

2020

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Thin polymer films have found many important applications in organic electronics, such as active layers, protective layers, or antistatic layers. Among the various experimental methods suitable for studying the thermo-optical properties of thin polymer films, temperature-dependent spectroscopic ellipsometry plays a special role as a nondestructive and very sensitive optical technique. In this Review Article, issues related to the physical origin of the dependence of ellipsometric angles on temperature are surveyed. In addition, the Review Article discusses the use of temperature-dependent spectroscopic ellipsometry for studying phase transitions in thin polymer films. The benefits of studying thermal transitions using different cooling/heating speeds are also discussed. Furthermore, it is shown how the analysis and modeling of raw ellipsometric data can be used to determine the thermal properties of thin polymer films.

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Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 88%

“…Quite recently, Erber at al. 40 used the analytically integrated form of eq 19 to describe the dependence of the layer thickness on temperature:…”

Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 99%

Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 99%

Section: Temperature-dependent Ellipsometric Modelingmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films

2020

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Hot-melt pressure-sensitive adhesive for seamless bonding of nylon fabric part I: effect of a functional monomer

Kuo

Chen

Lin

et al. 2018

Textile Research Journal

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This study synthesized a series of prepolymers from butyl acrylate and functional monomer with various side-chain structures. A bulk polymerization process was then applied under ultraviolet irradiation. The molecular structure of the prepolymer was characterized by Fourier transform infrared spectroscopy and gel permeation chromatography. The degradation temperature and glass transition temperature ( Tg) were examined. The prepolymer was employed to the acrylic hot-melt pressure-sensitive adhesives (HMPSAs) and the corresponding adhesive performance was presented. In this study, glycidyl methacrylate was considered to be an effective cross-linking agent for acrylic HMPSAs containing carboxylic acid groups. The prepolymer containing carboxylic acid synthesized acrylic HMPSAs exhibited high adhesion in peel strength and shear strength compared to the hydroxyethyl group. The adhesive performance of HMPSAs in different environments was also investigated.

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Temperature Coefficient of Electronic Polarizability in Thin Polymer Films Deposited on Si and SiO2 Substrates Determined via Spectroscopic Ellipsometry

Bednarski,

Hajduk,

Jarka

et al. 2024

Coatings

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Ellipsometry is widely used to determine the thermo-optical properties of thin polymer films. However, if the thermo-optic coefficient (TOC) and the linear thermal expansion coefficient (LTEC) are to be used to determine the temperature coefficient of electronic polarizability (TCEP) in thin polymer films, their values must be determined with the greatest possible accuracy, as both have the opposite effect. In this article, we analyze changes in ellipsometric parameters resulting from changes in the thin film temperature in order to develop a data analysis method for temperature-dependent spectroscopic ellipsometry that will facilitate the accurate determination of thermo-optical parameters, including the TCEP, in polymer thin films. As practical application examples, we identified optimal spectral windows to accurately determine the thermo-optical parameters of 50 to 150 nm-thick PMMA thin films deposited on Si and SiO2 substrates. The influence of thin-film thickness on the accuracy of TOC and LTEC determination is discussed.

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Glass Transition of Polymers with Different Architectures in the Confinement of Nanoscopic Films

Cited by 3 publications

References 56 publications

Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films

Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films

Hot-melt pressure-sensitive adhesive for seamless bonding of nylon fabric part I: effect of a functional monomer

Temperature Coefficient of Electronic Polarizability in Thin Polymer Films Deposited on Si and SiO2 Substrates Determined via Spectroscopic Ellipsometry

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