2013
DOI: 10.1186/2191-2521-2-3
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Gigapixel optical microscopy for meteorite characterization

Abstract: We present an automated microscopy system for the optical characterization of meteorite thin sections. The system employs focus-stacking and high-dynamic range imaging to facilitate high-contrast and unpolished samples. Images are acquired at ∼385 nm/pixel and automatically stitched together to create a billion-pixel image for a typical ∼1 cm 2 thin section. This image can be viewed in a web browser (with smooth panning and zooming) using a free browser plugin. The software we created to acquire and assemble t… Show more

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Cited by 3 publications
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“…All thin sections were initially studied by optical microscope and mapped using an automated microscopy mapping system developed by Ogliore and Jilly (2013). After carbon-coating, element X-ray maps of each thin section were obtained using the JEOL JXA-8500F electron microprobe at the University of Hawai'i.…”
Section: Cr Chondrite Samples and Petrographymentioning
confidence: 99%
“…All thin sections were initially studied by optical microscope and mapped using an automated microscopy mapping system developed by Ogliore and Jilly (2013). After carbon-coating, element X-ray maps of each thin section were obtained using the JEOL JXA-8500F electron microprobe at the University of Hawai'i.…”
Section: Cr Chondrite Samples and Petrographymentioning
confidence: 99%