Surface-diffusion length of aluminum-containing species (λAl) on 4H-SiC (0001) is estimated from the reported aluminum concentrations in 4H-SiC grown by chemical vapor deposition flowing SiH4, C3H8, trimethylaluminum, and H2 under carbon-rich conditions. Based on the surface-diffusion theory dealing with step dynamics, λAl at 1550 °C is estimated to be about 2 nm or less, which is shorter than a half of the mean distance of steps on an 8°-off (0001) surface (i.e. 3.6 nm). This explains why the reported aluminum concentration in 4H-SiC grown on an 8°-off (0001) substrate was larger than that grown on a 4°-off (0001) substrate.