In this chapter we present an overview of some important concepts related to the processes and microstructural mechanisms that produce the deformation of hysteresis loops and the loss of their symmetry characteristics in ferroelectric, ferroelastic and ferromagnetic systems. The most discussed themes include: aging and fatigue as primary mechanisms of biased hysteresis loops in ferroelectric/ferroelastic materials, imprint phenomenon as an important biasing process in ferroelectric thin films, the development of an exchange bias field and of specific spin states, such as spin canting and spin-glass-like phases, as the main causes of biased hysteresis loops in different types of magnetic heterostructures. The present discussion leads to the identification of the main differences and possible analogies in the underlying mechanisms of possible biasing effects occurring in the different ferroic systems, which can benefit the theoretical description, modelling, and engineering of multifunctional devices based on ferroic systems experiencing the internal bias phenomena.