2021
DOI: 10.1002/pssr.202100041
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Giant Enhancement of External Quantum Efficiency in Near‐UV Organic Light‐Emitting Diodes via Device Aging and Impedance Spectroscopy Analysis

Abstract: The issue of device durability is scarcely reported for state‐of‐the‐art UV organic light‐emitting diodes (UV OLEDs), but it is of theoretical interest and plays a key role in commercial products. Herein, the effects of aging time on current density and radiance of near‐UV OLEDs are investigated. Devices are fabricated with 9‐(4′‐(4,5‐diphenyl‐4H‐1,2,4‐triazol‐3‐yl)‐(1,1′‐biphenyl)‐4‐yl)‐9H‐carbazole as the fluorescent molecule, poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonate) as the hole injection laye… Show more

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Cited by 4 publications
(1 citation statement)
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“…State‐of‐the‐art UV OLEDs are predominantly focused on normal structure for enhancing device efficiency and radiance. The typical external quantum efficiency (EQE) of UV OLEDs with conventional fluorescent molecules has been enhanced from initial 0.1% [ 8 ] to 4.6% [ 9 ] and soared to 8.2% [ 10 ] via device aging and was recently promoted to 9.3% from thermally activated delayed fluorescent material. [ 11 ] Inverted UV OLEDs are scarcely reported, [ 12,13 ] due to the fact of lacking a strong electron injection layer (EIL), which results in a high electron injection barrier between the commonly used transparent indium tin oxide (ITO) cathode and typical electron transport layer (ETL).…”
Section: Introductionmentioning
confidence: 99%
“…State‐of‐the‐art UV OLEDs are predominantly focused on normal structure for enhancing device efficiency and radiance. The typical external quantum efficiency (EQE) of UV OLEDs with conventional fluorescent molecules has been enhanced from initial 0.1% [ 8 ] to 4.6% [ 9 ] and soared to 8.2% [ 10 ] via device aging and was recently promoted to 9.3% from thermally activated delayed fluorescent material. [ 11 ] Inverted UV OLEDs are scarcely reported, [ 12,13 ] due to the fact of lacking a strong electron injection layer (EIL), which results in a high electron injection barrier between the commonly used transparent indium tin oxide (ITO) cathode and typical electron transport layer (ETL).…”
Section: Introductionmentioning
confidence: 99%