Abstract:Dy 2/3 Cu 3 Ti 4 O 12 ceramics were successfully synthesized by solid-state reaction process, and the crystal structure, microstructure and dielectric properties were systematically investigated. It has been found that Dy 2/3 Cu 3 Ti 4 O 12 ceramics exhibit giant dielectric constants (e 0 * 10 4 at 1 kHz and room temperature) and have two thermal-activated dielectric relaxations at low and high temperatures, which are quite similar to those reported in CaCu 3 Ti 4 O 12 ceramics. The low-temperature dielectric … Show more
“…As indicated in Table 2, the activation energies of the high frequency relaxation peaks E HFR are 0.091 eV and 0.095 eV for SPS025 and CS090, respectively. These values are in good agreement with the widely reported value of ∼ 0.1 eV for the intrinsic relaxation in grains [39,40] and comparable with the activation energy for hopping of electrons between Ti 3+ and Ti 4+ ions (0.13 eV). [41] Therefore, the HFR relaxation peaks are thought to be linked with the structure defects inside the grains such as oxygen vacancies and the multivalent ions.…”
Na0.5Sm0.5Cu3Ti4O12 (NSCTO) ceramics have been prepared by reactive sintering of amorphous powder. Spark plasma sintering (SPS) for 10 min at 1025 °C and conventional sintering (CS) for 10 h at 1090 °C have been employed. X-ray diffraction measurements confirmed the pure CCTO-like phase for SPS and CS NSCTO ceramics. The SPS ceramic showed an average grain size of 500 nm, which is much smaller than that of the CS (
∼
5
μ
m
) sample. The impedance spectroscopy measurements revealed an electrically inhomogeneous structure in the prepared ceramics. While the resistivities of grains of both ceramic samples were in the same order of magnitude, the resistivity of grain-boundaries of the CS ceramic was three orders of magnitude greater than that of the SPS ceramic. Both of the samples showed giant dielectric constant (
>
10
3
) over wide ranges of temperatures and frequencies. Nevertheless, the room-temperature dielectric loss of the SPS NSCTO (3.2 at 1.1 kHz) ceramic sample was higher than that of the CS NSCTO (0.08 at 1.1 kHz) ceramic sample due to the reduced grain-boundary resistivity of the former. Two dielectric relaxations were detected for each sample and attributed to the relaxations in grains and grain-boundaries. The dielectric behavior of the SPS and CS NSCTO ceramics could be interpreted in terms of the internal barrier layer capacitor (IBLC) model.
“…As indicated in Table 2, the activation energies of the high frequency relaxation peaks E HFR are 0.091 eV and 0.095 eV for SPS025 and CS090, respectively. These values are in good agreement with the widely reported value of ∼ 0.1 eV for the intrinsic relaxation in grains [39,40] and comparable with the activation energy for hopping of electrons between Ti 3+ and Ti 4+ ions (0.13 eV). [41] Therefore, the HFR relaxation peaks are thought to be linked with the structure defects inside the grains such as oxygen vacancies and the multivalent ions.…”
Na0.5Sm0.5Cu3Ti4O12 (NSCTO) ceramics have been prepared by reactive sintering of amorphous powder. Spark plasma sintering (SPS) for 10 min at 1025 °C and conventional sintering (CS) for 10 h at 1090 °C have been employed. X-ray diffraction measurements confirmed the pure CCTO-like phase for SPS and CS NSCTO ceramics. The SPS ceramic showed an average grain size of 500 nm, which is much smaller than that of the CS (
∼
5
μ
m
) sample. The impedance spectroscopy measurements revealed an electrically inhomogeneous structure in the prepared ceramics. While the resistivities of grains of both ceramic samples were in the same order of magnitude, the resistivity of grain-boundaries of the CS ceramic was three orders of magnitude greater than that of the SPS ceramic. Both of the samples showed giant dielectric constant (
>
10
3
) over wide ranges of temperatures and frequencies. Nevertheless, the room-temperature dielectric loss of the SPS NSCTO (3.2 at 1.1 kHz) ceramic sample was higher than that of the CS NSCTO (0.08 at 1.1 kHz) ceramic sample due to the reduced grain-boundary resistivity of the former. Two dielectric relaxations were detected for each sample and attributed to the relaxations in grains and grain-boundaries. The dielectric behavior of the SPS and CS NSCTO ceramics could be interpreted in terms of the internal barrier layer capacitor (IBLC) model.
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