Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: Example Cu<sub>3</sub>Au

Hÿch, M. J.; Potez, L.

doi:10.1080/01418619708214218

Cited by 76 publications

(32 citation statements)

References 17 publications

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“…The reason is that wavelet transform is not adapted here because the frequency of the carrier is known a priori and is only slightly modulated by straining. The use of the FT in the particular case of grids is mentioned in or in for instance. In these last references, this gave birth to the so‐called Geometric Phase Analaysis (GPA) briefly described in Section 4.3.…”

Section: Processing Grid Images To Extract Displacement and Strain Fimentioning

confidence: 99%

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

Grédiac

Sur

Blaysat

2016

Strain

140

162

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The grid method is a technique suitable for the measurement of in-plane displacement and strain components on specimens undergoing a small deformation. It relies on a regular marking of the surfaces under investigation. Various techniques are proposed in the literature to retrieve these sought quantities from images of regular markings, but recent advances show that techniques developed initially to process fringe patterns lead to the best results. The grid method features a good compromise between measurement resolution and spatial resolution, thus making it an efficient tool to characterise strain gradients. Another advantage of this technique is the ability to establish closed-form expressions between its main metrological characteristics, thus enabling to predict them within certain limits. In this context, the objective of this paper is to give the state of the art in the grid method, the information being currently spread out in the literature. We propose first to recall various techniques that were used in the past to process grid images, to focus progressively on the one that is the most used in recent examples: the windowed Fourier transform. From a practical point of view, surfaces under investigation must be marked with grids, so the techniques available to mark specimens with grids are presented. Then we gather the information available in the recent literature to synthesise the connection between three important characteristics of full-field measurement techniques: the spatial resolution, the measurement resolution and the measurement bias. Some practical information is then offered to help the readers who discover this technique to start using it. In particular, programmes used here to process the grid images are offered to the readers on a dedicated website. We finally present some recent examples available in the literature to highlight the effectiveness of the grid method for in-plane displacement and strain measurement in real situations.

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Section: Processing Grid Images To Extract Displacement and Strain Fimentioning

confidence: 99%

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

Grédiac

Sur

Blaysat

2016

Strain

140

162

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“…19 The GPA strain represents a relative lattice strain that is generally defined as e GPA ¼ , where d f 2 24g is the f 2 24g plane distance for the (In,Ga)As QW or the GaAs ISC taken as reference and that e yy ¼ , where d f2 20g is the f2 20g plane distance for the (In,Ga)As QW or the GaAs ISC taken as reference. For the experimental GPA calculations, we assumed that the GaAs ISC is in a bulk state.…”

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confidence: 99%

Plan-view transmission electron microscopy investigation of GaAs/(In,Ga)As core-shell nanowires

Grandal

Kong

et al. 2014

Applied Physics Letters

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Plan-view transmission electron microscopy in combination with electron energy-loss spectroscopy have been used to analyze the strain and the chemical composition of GaAs/(In,Ga)As core-shell nanowires. The samples consist of an GaAs core and a radially arranged (In,Ga)As layer as quantum well and GaAs outer-shell. The nominal parameters of the quantum well in the two samples under investigation are: an indium concentration of 25% and a quantum well thickness of 22 nm and 11 nm, respectively, while the core and the external shell dimensions are fixed. Scanning transmission electron microscopy using high-angle annular dark field detector was performed to verify the actual dimensions of the layers. Geometric phase analysis was carried out in order to examine the local strain of the radial (In,Ga)As quantum well, while the local chemical composition was determined by means of spatially resolved electron energy-loss spectroscopy. Finite elements calculations were carried out in order to simulate the multi-shell structure and extract the actual strain distribution. The results indicate that there is a uniform strain distribution at the coherent interfaces. In addition, based on calculations, we show that there is no region in the considered core-shell structure absolutely free of strain.

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“…The principle of the GPA method [1][2][3] The process of the GPA method, shown in Fig. 1, can be introduced briefly as follows: perform the FT on a reference grid image and a deformed grid image, then two frequency spectrums are obtained, respectively; subsequently center the filter functions on corresponding reflections in both frequency spectrums and conduct filtering, as shown in Fig.…”

Section: Introductionmentioning

confidence: 99%

“…The GPA method, presented by Hÿch [1], is initially applied to measure the deformation from the high resolution transmission electron microscope image [2][3][4][5][6][7]. Recently, combining with the advanced fabrication techniques of high-frequency gratings [8][9][10], GPA has been widely used in the deformation measurement at micro-and nano-scale [11][12][13][14][15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Geometric phase analysis based on the windowed Fourier transform for the deformation field measurement

Dai

Xie

Wang

2014

Optics & Laser Technology

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Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: Example Cu₃Au

Cited by 76 publications

References 17 publications

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

Plan-view transmission electron microscopy investigation of GaAs/(In,Ga)As core-shell nanowires

Geometric phase analysis based on the windowed Fourier transform for the deformation field measurement

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Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: Example Cu3Au

Cited by 76 publications

References 17 publications

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

The Grid Method for In‐plane Displacement and Strain Measurement: A Review and Analysis

Plan-view transmission electron microscopy investigation of GaAs/(In,Ga)As core-shell nanowires

Geometric phase analysis based on the windowed Fourier transform for the deformation field measurement

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Product

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Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: Example Cu₃Au