2019
DOI: 10.21203/rs.2.10187/v2
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Genome-wide association study reveals new loci for yield-related traits in Sichuan wheat germplasm under stripe rust stress

Abstract: caused by fungus Puccinia striiformis Westend. f. sp. tritici Erikss. (Pst) is a serious threat to wheat production [2]. Therefore, improving wheat yield under stripe rust stress is extremely urgent. Thus, identifying loci associated with yield-related traits under stripe rust stress may provide favourable alleles and their useful markers for breeding wheat cultivars with high yield in combination with stripe rust resistance. The productive spike number per unit area, kernel number per spike (KPS) and thousand… Show more

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