Abstract:Abstract. Fine-grain Sleep Transistor Insertion (FGSTI) is an effective leakage reduction method in VLSI design optimization. In this paper, a novel Genetic Algorithm (GA) based FGSTI technique is presented to decide where to put the sleep transistors (ST) when the circuit slowdown is not enough to assign sleep transistors everywhere in the combinational circuits. Penalty based fitness function with a built-in circuit delay calculator is used to meet the performance constraint. Although optimal FGSTI problem i… Show more
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