2018
DOI: 10.1016/j.optlaseng.2018.06.001
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Generic exponential fringe model for alleviating phase error in phase measuring profilometry

Abstract: Phase measuring profilometry (PMP) is susceptible to phase error caused by gamma distortion that leads to the captured fringe patterns deviating from ideal sinusoidal waveforms. Existing phase-error compensation methods are generally complex and require significant computational resources for implementation. This paper proposes a generic exponential fringe model expressed as an exponential function of the generated fringe patterns. Based on this model, a straightforward gamma correction method is presented to … Show more

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Cited by 41 publications
(5 citation statements)
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References 22 publications
(37 reference statements)
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“…Accordingly, the inspection techniques develop in the direction of high precision, high efficiency, and low cost. As an approach to observing the surface topography, structured light projection [1,2] technology has promising applications in many fields, such as industrial processing supervision [3,4], intelligent machine vision [5][6][7][8], and biomedical engineering [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…Accordingly, the inspection techniques develop in the direction of high precision, high efficiency, and low cost. As an approach to observing the surface topography, structured light projection [1,2] technology has promising applications in many fields, such as industrial processing supervision [3,4], intelligent machine vision [5][6][7][8], and biomedical engineering [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…Three-dimensional (3D) shape measurement technique is becoming increasingly important in various applications. [1][2][3][4][5] Many measurement methods have been put forward to reconstruct the 3D shape of object surfaces, especially for the objects with diffused surfaces. [6][7][8][9][10] However, the research of 3D shape measurement for specular objects is still in the early stage.…”
Section: Introductionmentioning
confidence: 99%
“…Potential sources for measurement uncertainty in the DFP method include projector gamma nonlinearity [9][10][11], projector and camera quantization effects [12][13][14], and pixel intensity noise [15][16][17][18]. Substantial work has been made to quantify and mitigate the height profile measurement error caused by non-linear projector gamma [19][20][21][22] and other publications address measurement uncertainty and mitigation caused by projector and camera quantization [23][24][25].…”
Section: Introductionmentioning
confidence: 99%