Generation of X rays at the grazing incidence of 18-MeV electrons on a thin Si crystal in a betatron chamber

New microfocus source based on a betatron for hard X-rays imaging

“…Figure 4a shows a fragment of a positive image of the Duplex IQI obtained at magnification 𝑀 = ×2.3 (𝐿 1 = 50 cm, 𝐿 2 = 114 cm) using Bs generated in a 13-μm-thick Ta target oriented alone the electron beam. The photo shows a rather high contrast image of a pair of Pt wires 50 μm in diameter, despite the fact that the transparency of the Pt wires for Bs is much higher than that in the case of softer Bs generated in the Si target [1]. The pair's wires features high resolution due to a small horizontal size of the source.…”

“…The vertical size of the source is equal to the diameter (about 1.4 mm) of the inner electron beam of the betatron. Such dependence of the size 𝑆 𝐻 was investigated in [1] using the Duplex IQI and Bs generated in a 50-μm-thick Si target.…”

“…The first experimental results obtained using a new microfocus Bs source based on the B-18 betatron with narrow silicon (Si) and tantalum (Ta) targets inside were reported in [1,2]. High resolution and contrast of magnified images of microobjects were demonstrated [1]. The involvement of the refraction of Bs in generation of plastic and steel plate edge images has also been shown [2].…”

“…Feasibility of creating new microfocus sources of Bremsstrahlung (Bs) based on small-sized betatrons was studied using the experimental setup developed on the basis of the B-18 betatron with electron energy of 18 MeV. The first experimental results obtained using a new microfocus Bs source based on the B-18 betatron with narrow silicon (Si) and tantalum (Ta) targets inside were reported in [1,2]. High resolution and contrast of magnified images of microobjects were demonstrated [1].…”