Generation of Mesoband Signals With Optoelectronic Technique and a Combiner for Intentional Electromagnetic Interference Conducted Tests

Abstract

In this article, a source for generating conducted intentional electromagnetic interference (IEMI) with a mesoband spectrum is presented in order to perform electromagnetic susceptibility tests on electronic equipment. This high voltage source is based on different optoelectronic generators which integrate photoconductive semiconductor switches (PCSS) operating in linear switching mode and triggered by a laser pulse. These optoelectronic devices generate a damped sinusoidal signal with a center frequency between 20 and 200 MHz, a Q factor between 11 and 12.4, and a maximum peak-to-peak magnitude of 3.12 kV for a bias voltage of 4 kV. An optoelectronic generator model was designed using Advance Design System (ADS) software and experimental tests were performed with a measurement bench to compare simulated and measured results. A study on a voltage increase of these generators has been performed, and has established the experimental limits of generation in planar technology with low-cost PCSS available on the shelf. The highest peak-to-peak magnitude value obtained is 6.10 kV and was possible thanks to the design and manufacture of a power combiner, with ADS and CST Suite Studio softwares, to set up a multi-way combination.