Generation of Long-time Complex Signals for Testing the Instruments for Detection of Voltage Quality Disturbances

Abstract

Software supported procedure for generation of long-time complex test sentences, suitable for testing the instruments for detection of standard voltage quality (VQ) disturbances is presented in this paper. This solution for test signal generation includes significant improvements of computer-based signal generator presented and described in the previously published paper [1]. The generator is based on virtual instrumentation software for defining the basic signal parameters, data acquisition card NI 6343, and power amplifier for amplification of output voltage level to the nominal RMS voltage value of 230 V. Definition of basic signal parameters in LabVIEW application software is supported using Script files, which allows simple repetition of specific test signals and combination of more different test sequences in the complex composite test waveform. The basic advantage of this generator compared to the similar solutions for signal generation is the possibility for long-time test sequence generation according to predefined complex test scenarios, including various combinations of VQ disturbances defined in accordance with the European standard EN50160. Experimental verification of the presented signal generator capability is performed by testing the commercial power quality analyzer Fluke 435 Series II. In this paper are shown some characteristic complex test signals with various disturbances and logged data obtained from the tested power quality analyzer.

Metrology and Measurement Systems

“…Formula (12) shows that K D i can be calculated using only shift and add operations, which is extremely convenient in implementing it in digital circuits.…”

“…The rotation angle is 2θ i in each iterative process and K D i , calculated accurately with (12), is introduced simultaneously to compensate the change in modulus length caused by rotation. Namely, Amp is amplified with the value of K D i .…”

“…In practice, the digital subdivision method, in which digital circuits are employed in the amplitude-based subdivision method, have been widely used in subdivision systems because of its simple mechanism, flexibility of parameter adjustment, and convenience of high integration [11,12]. The digital subdivision is accomplished based on the relationship between the measured position and phase of a periodic signal.…”