Generation and absorption of characteristic X-rays under dynamical electron diffraction conditions

Rossouw, C. J.; Forwood, C. T.; Gibson, Mark; Miller, Peter

doi:10.1016/s0968-4328(96)00050-9

Cited by 41 publications

(17 citation statements)

References 29 publications

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“…Therefore, it is generally recommended to avoid quantitative X-ray analysis from regions showing strong diffraction conditions. Abnormal X-ray emission can be theoretically estimated with information about the crystallographic structures and known diffraction conditions (Allen et al, 1994;Rossouw et al, 1997). Therefore, it is possible to incorporate 'the channeling correction term, C' into Eq.…”

Section: Limits Of the ζ-Factor Methodsmentioning

confidence: 99%

The quantitative analysis of thin specimens: a review of progress from the Cliff‐Lorimer to the new ζ‐factor methods

Watanabe

Williams

2006

Journal of Microscopy

227

210

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SummaryA new quantitative thin-film X-ray analysis procedure termed the ζ -factor method is proposed. This new ζ -factor method overcomes the two major limitations of the conventional CliffLorimer method for quantification: (1) use of pure-element rather than multielement, thin-specimen standards and (2) built-in X-ray absorption correction with simultaneous thickness determination. Combined with a universal, standard, thin specimen, a series of ζ -factors covering a significant fraction of the periodic table can be estimated. This ζ -factor estimation can also provide information about both the detector efficiency and the microscope-detector interface system. Light-element analysis can also be performed more easily because of the built-in absorption correction. Additionally, the new ζ -factor method has several advantages over the Cliff-Lorimer ratio method because information on the specimen thickness at the individual analysis points is produced simultaneously with compositions, thus permitting concurrent determination of the spatial resolution and the analytical sensitivity. In this work, details of the ζ -factor method and how it improves on the Cliff-Lorimer approach are demonstrated, along with several applications.

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Section: Limits Of the ζ-Factor Methodsmentioning

confidence: 99%

The quantitative analysis of thin specimens: a review of progress from the Cliff‐Lorimer to the new ζ‐factor methods

Watanabe

Williams

2006

Journal of Microscopy

227

210

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“…Fluorescence yields, the absorption of x-rays by the specimen 18 and detector efficiency could also be considered but those refinements will not be taken into account in this paper. Figure 3 shows simulated EELS and EDX elemental maps of the oxygen K-shell edge in 001 strontium titanate for the experimental results shown in Figs.…”

Section: Theorymentioning

confidence: 99%

Contribution of thermally scattered electrons to atomic resolution elemental maps

et al. 2012

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Electron energy-loss spectroscopy (EELS) and energy dispersive x-ray (EDX) analysis in scanning transmission electron microscopy (STEM) have the ability to produce elemental maps of a specimen at atomic resolution. In this paper we present EELS and EDX maps for the oxygen K-shell in 001 strontium titanate. The results initially seem to be anomalous since substantially more signal is obtained when the STEM probe is above the columns containing both titanium and oxygen than those containing only oxygen. This is at variance with the stoichiometry -the density of oxygen in both types of columns is the same. Using theory, we show that an understanding of the direct contribution to the recorded signal from electrons which have been thermally scattered is the key to understanding these results. We contrast these results to elemental maps of 110 strontium titanate. Whilst the experimental results are not directly interpretable, they are in concert with simulations from first-principles such as those presented in this paper.

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“…In this nomenclature, k x =g 4 0 0 ¼ 1 corresponds to the exact Bragg condition with a 4 0 0 reflection. The intensities of Al-K and O-K are higher than that of Mg-K in the range jk x =g 4 0 0 j < 1, Calculator) program [11] based on the dynamical diffraction theory [12,13]. The occupation probabilities for IV sites and VI/fcc sites thus obtained are listed in Table 1.…”

Section: Harecxs Analysismentioning

confidence: 99%

Radiation-induced disordering in magnesium aluminate spinel subjected to ionizing radiation

Shimada

Matsumura

Yasuda

et al. 2004

Journal of Nuclear Materials

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Generation and absorption of characteristic X-rays under dynamical electron diffraction conditions

Cited by 41 publications

References 29 publications

The quantitative analysis of thin specimens: a review of progress from the Cliff‐Lorimer to the new ζ‐factor methods

The quantitative analysis of thin specimens: a review of progress from the Cliff‐Lorimer to the new ζ‐factor methods

Contribution of thermally scattered electrons to atomic resolution elemental maps

Radiation-induced disordering in magnesium aluminate spinel subjected to ionizing radiation

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