Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

Petrosyants, Konstantin O.; Sambursky, Lev M.; Kharitonov, I. A.; Ismail-zade, Mamed R.

doi:10.1109/ewdts.2017.8110055

2017 IEEE East-West Design &Amp; Test Symposium (EWDTS) 2017

DOI: 10.1109/ewdts.2017.8110055

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Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

Konstantin O. Petrosyants

Lev M. Sambursky

I. A. Kharitonov

et al.

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Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

Cited by 2 publications

References 22 publications

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Early Study of Transistor and Circuit Parameter Variation for 180 nm High-Temperature SOI CMOS Production Technology

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