1997
DOI: 10.1063/1.119623
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Ge nanocrystals in SiO2 films

Abstract: SiO 2 /Ge nanocrystal/SiO2 structures have been fabricated by deposition of Ge film on a SiO2 layer and subsequent oxidation of the structure at a temperature between 800 °C and 1000 °C. Secondary ion mass spectrometry results indicate that the Ge precipitates into the bulk SiO2 at a density of 1×1012 cm−2. Raman spectra show a sharp peak at 300 cm−1 for the nanocrystallized Ge. The nanocrystal diameter is determined to be 5 nm on average. In the metal–insulator–silicon structure, electron storage occurs in th… Show more

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Cited by 62 publications
(33 citation statements)
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“…These suggest Ge departure from the multilayer that needs to be explained. As a matter of fact, thermal diffusion of Ge atoms in SiO 2 towards the substrate was found to be notable in the literature in the case of annealing at high temperatures [17,18].…”
Section: Methodsmentioning
confidence: 99%
“…These suggest Ge departure from the multilayer that needs to be explained. As a matter of fact, thermal diffusion of Ge atoms in SiO 2 towards the substrate was found to be notable in the literature in the case of annealing at high temperatures [17,18].…”
Section: Methodsmentioning
confidence: 99%
“…This particular size-dependent optical characteristic has been proposed to lead to important applications for the nanoparticles in the applications of optoelectronic devices [3][4][5], light-emitting devices [6], and photopumped tunable lasers. [7] Recently, luminescent silicon nanoparticles have been prepared by a variety of physical and chemical approaches such as electrochemical etching [8], ion implantation [9], thermal vaporization [10], laser ablation [11], and gas phase decomposition of silanes [12,13]. Solution chemistry routes are attractive because particle size and surface chemistry can be controlled simultaneously.…”
Section: Introductionmentioning
confidence: 99%
“…For Ge, most visible photoluminescence (PL) was reported from low-dimensional structures involving Ge nanocrystals embedded in SiO 2 [4][5][6][7][8][9][10][11][12]. Maeda and co-workers [5] observed PL at room temperature in Ge microcrystals embedded in SiO 2 matrix prepared by radio frequency magnetron co-sputtering for the first time.…”
Section: Introductionmentioning
confidence: 96%