1998
DOI: 10.1103/physrevlett.81.1536
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Gawliket al.Reply:

Abstract: Gawlik et al. Reply:The Comment [1] avoids the main point of our Letter [2], namely, that for HgSe there is no evidence for a bulk conduction band state crossing or touching the valence band maximum determined by photoemission spectroscopy excited with different photon energies. This is a fundamental criterion for a metallic band structure. Therefore, from our experimental data an inverted band structure model for HgSe is not supported.Furthermore, the discussion of quantized charge accumulation states as perf… Show more

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Cited by 14 publications
(7 citation statements)
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“…The procedure of locally etching the continuous sGe fins and introduction of SiGe in the etched-out regions is expected to lead to stress relaxation along the fins, while the stress in the across direction is assumed to be unaffected. Despite the interruption of the fins in the ECS Transactions, 86 (7) 311-320 (2018) parallel direction over a length scale much smaller than the laser wavelength, the Raman scattering from the sGe region is still increased under parallel orientation with the incident polarization, albeit with a lower enhancement factor compared to continuous fins (4,21). This enables the same analysis with independent LO and TO phonon excitation as in the case of intact fins and hence the determination of stress relaxation upon S/D integration in the fins.…”
Section: Source/drain Integrationmentioning
confidence: 99%
“…The procedure of locally etching the continuous sGe fins and introduction of SiGe in the etched-out regions is expected to lead to stress relaxation along the fins, while the stress in the across direction is assumed to be unaffected. Despite the interruption of the fins in the ECS Transactions, 86 (7) 311-320 (2018) parallel direction over a length scale much smaller than the laser wavelength, the Raman scattering from the sGe region is still increased under parallel orientation with the incident polarization, albeit with a lower enhancement factor compared to continuous fins (4,21). This enables the same analysis with independent LO and TO phonon excitation as in the case of intact fins and hence the determination of stress relaxation upon S/D integration in the fins.…”
Section: Source/drain Integrationmentioning
confidence: 99%
“…Recently, the nature of the material HgSe was debated, whether it is a small‐gap semiconductor or a semimetal in the zinc blend structure. Experimentally, as determined using photoemission spectroscopy 4, there seemed to be no evidence of a bulklike conduction band that either crosses or touches the valence‐band maximum, hence favoring it to be a small‐gap (0.42 eV) semiconductor. On the other hand, conductivity, optical and magneto‐optical measurements 5, compiled in Ref.…”
Section: Introductionmentioning
confidence: 97%
“…This proceeding reports on the 72 Ge(n, γ) measurement performed at n_TOF. Lastly, there are more capture cross section results on other stable germanium isotopes from n_TOF recently [5][6][7]. * e-mail: mirco.dietz@ptb.de…”
Section: Introductionmentioning
confidence: 99%