Gated-V/sub dd/: a circuit technique to reduce leakage in deep-submicron cache memories

Abstract

Deep-submicron CMOS designs have resulted in large leakage energy dissipation in microprocessors. While SRAM cells in onchip cache memories always contribute to this leakage, there is a large variability in active cell usage both within and across applications. This paper explores an integrated architectural and circuitlevel approach to reducing leakage energy dissipation in instruction caches. We propose, guted-vdd, a circuit-level technique to gate the supply voltage and reduce leakage in unused SRAM cells.our results indicate that gated-Vdd together with a novel resizable cache architecture reduces energy-delay by 62% with minimal impact on performance.

NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded Systems

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Head-of-Line Blocking Reduction in Power-Efficient Networks-on-Chip

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