2007
DOI: 10.1016/j.nimb.2007.04.277
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Gas cluster ion beam surface treatments for reducing field emission and breakdown of electrodes and SRF cavities

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Cited by 7 publications
(2 citation statements)
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“…It is well known that the surface state of a cavity plays an important role in achieving the required performance. The rough surface and surface contaminants that remain after the surface treatment of a cavity degrade its performance because of magnetic field enhancement and field emission [4][5][6]. Electropolishing (EP), which is used to smoothen a surface by anodic dissolution in an electrolyte under mass transport control [7,8], was found to be a promising technique for the final surface treatment of Nb SRF cavities [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…It is well known that the surface state of a cavity plays an important role in achieving the required performance. The rough surface and surface contaminants that remain after the surface treatment of a cavity degrade its performance because of magnetic field enhancement and field emission [4][5][6]. Electropolishing (EP), which is used to smoothen a surface by anodic dissolution in an electrolyte under mass transport control [7,8], was found to be a promising technique for the final surface treatment of Nb SRF cavities [9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…Recent experiments [1][2][3][4] have shown that the gas cluster ion beam (GCIB) technique is a highly desirable tool for treating Nb surfaces to reduce field emission. In order to use this new technique in an optimized fashion, it is important to understand what kind of effects this new tool has on the treated Nb surfaces.…”
Section: Introductionmentioning
confidence: 99%