Abstract:Solar assisted heat pump (SAHP) system integrates a solar thermal energy source with a heat pump. This technique is a very fundamental concept, especially for drying applications. By combining a solar thermal energy source such as solar thermal collectors and a heat pump dryer will assist in reducing the operation cost of drying and producing products with high quality. Many review papers in the literature evaluated the R&D aspects of solar-assisted heat pump dryers (SAHPD). This critical review paper studies … Show more
“…The series resistance, "RS", and the ideality factor, "n", are crucial parameters that indicate the electrical characteristics of the diodes. These values can be determined using the equation [2,16,17]:…”
Section: Mathematical Approach On the Extraction Of Schottky Diode Pa...mentioning
confidence: 99%
“…Additionally, atomic displacement, which results from irradiation and produces primary knock-on atoms (PKA), leads to lattice defects [22,23,24]. Studies have shown that exposure of ZnO-based semiconductors to gamma radiation results in a deterioration of their electrical parameters, as evidenced by a decrease in turn-on voltage, which is caused by structural defects present in the semiconductor, leading to an increase in its ideality factor [1,2,24,25]. These alterations can also be attributed to the combined effects of the creation of interface states and the generation of electron-hole pairs in the insulating layer.…”
Section: Steady State Analysismentioning
confidence: 99%
“…ZnO possesses a wide bandgap of 3.34 eV at room temperature and a binding energy in the UV-A region (320-400 nm), along with attractive attributes such as a large surface area, low toxicity, chemical stability, electrochemical activity, and excellent conductivity [1][2] [3]. Furthermore, CuGaO2 and Cu2O have the potential to form heterojunctions with ZnO-based semiconductors because of their low lattice mismatch [2]. Previous studies have revealed that ZnO films exposed to radiation from Cobalt-60 (Co-60) showed a decline in turn-on voltage and lowfrequency noise [4,5], but an increase in electron mobility.…”
In this paper, we present the investigation results of radiation-induced effects in metal-oxide-semiconductor (MOS) doped with moderate amounts of Zinc Oxide (ZnO) as a potential candidate for space-borne application. The samples were fabricated via the sputtering method at a working pressure of 3mTorr and a deposition temperature of 300oC. The ZnO samples were exposed to 1.25-MeV gamma-ray utilizing Co60 source, and their electronic response was measured at ionizing doses ranging from 10 kGy to 300 kGy. A comparative work was performed through finite element method to simulate the electronic response of the PN junction diode due to ionizing radiation. The results indicate that the ideality factor of the MOS diode increases as the ionizing dose increases, rendering it unsuitable for use as a diode. The degradation of the electrical parameters was also simulated, showing the increase in hole concentration. These findings suggest that the ejection of electrons occurred, which agrees with the gamma radiation effects trend. Furthermore, as the intensity of radiation increases, the spatial charge that arises from the separation of hole-electron pairs results in a substantial reduction of the electric field in the central portion of the n-type region. These findings provide insights into the degradation of electrical parameters in MOS devices under gamma radiation and have implications for their use in space-borne applications.
“…The series resistance, "RS", and the ideality factor, "n", are crucial parameters that indicate the electrical characteristics of the diodes. These values can be determined using the equation [2,16,17]:…”
Section: Mathematical Approach On the Extraction Of Schottky Diode Pa...mentioning
confidence: 99%
“…Additionally, atomic displacement, which results from irradiation and produces primary knock-on atoms (PKA), leads to lattice defects [22,23,24]. Studies have shown that exposure of ZnO-based semiconductors to gamma radiation results in a deterioration of their electrical parameters, as evidenced by a decrease in turn-on voltage, which is caused by structural defects present in the semiconductor, leading to an increase in its ideality factor [1,2,24,25]. These alterations can also be attributed to the combined effects of the creation of interface states and the generation of electron-hole pairs in the insulating layer.…”
Section: Steady State Analysismentioning
confidence: 99%
“…ZnO possesses a wide bandgap of 3.34 eV at room temperature and a binding energy in the UV-A region (320-400 nm), along with attractive attributes such as a large surface area, low toxicity, chemical stability, electrochemical activity, and excellent conductivity [1][2] [3]. Furthermore, CuGaO2 and Cu2O have the potential to form heterojunctions with ZnO-based semiconductors because of their low lattice mismatch [2]. Previous studies have revealed that ZnO films exposed to radiation from Cobalt-60 (Co-60) showed a decline in turn-on voltage and lowfrequency noise [4,5], but an increase in electron mobility.…”
In this paper, we present the investigation results of radiation-induced effects in metal-oxide-semiconductor (MOS) doped with moderate amounts of Zinc Oxide (ZnO) as a potential candidate for space-borne application. The samples were fabricated via the sputtering method at a working pressure of 3mTorr and a deposition temperature of 300oC. The ZnO samples were exposed to 1.25-MeV gamma-ray utilizing Co60 source, and their electronic response was measured at ionizing doses ranging from 10 kGy to 300 kGy. A comparative work was performed through finite element method to simulate the electronic response of the PN junction diode due to ionizing radiation. The results indicate that the ideality factor of the MOS diode increases as the ionizing dose increases, rendering it unsuitable for use as a diode. The degradation of the electrical parameters was also simulated, showing the increase in hole concentration. These findings suggest that the ejection of electrons occurred, which agrees with the gamma radiation effects trend. Furthermore, as the intensity of radiation increases, the spatial charge that arises from the separation of hole-electron pairs results in a substantial reduction of the electric field in the central portion of the n-type region. These findings provide insights into the degradation of electrical parameters in MOS devices under gamma radiation and have implications for their use in space-borne applications.
Solution-based bottom-gate zinc oxide thin film transistors (TFTs) were fabricated, remaining functional and demonstrating stability under extreme gamma irradiation conditions. Unpassivated TFTs were fabricated on samples with different number of ZnO layers grown via sol-gel spin coating technique. The devices were characterized before and after exposure to a cumulative dose of 220 MRad (air) of gamma irradiation. Atomic force microscopy (AFM), x-ray diffraction (XRD), and photoluminescence (PL) were employed to characterize the TFT active layers. Thickness measurements and optical images suggest the removal of the channel surface, conceivably due to cumulative effect of displacement damage near the ZnO surface. Device electrical characteristics were extracted from current-voltage measurements. The impact of displacement damage on the degradation/enhancement of device characteristics as a consequence of surface/bulk effects is discussed.
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