2019
DOI: 10.1364/ome.9.004187
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Gallium nitride thin films by microwave plasma-assisted ALD

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Cited by 6 publications
(10 citation statements)
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“…The characteristic peaks of E 2 (low), E 2 (low), and A 1 (LO) belonging to GaN can be detected through a strategy of prolonging the collection time (Figure 4g), implying the bond formation of Ga−N. 27 The characteristic peaks of Ga 2p 1/2 , Ga 2p 3/2 , and Ga 3d centered at 1144.8, 1117.9, and 19.7 eV match well with the standard XPS peaks of GaN, 28 revealing again the successful substitution of the N element to the O element (Figure 4h,i). In Figure 4i, the fitting spectra of N 1s show the obvious contribution of the Ga−N bond (397.5 eV), overlapped with the Auger electron signal originating from Ga LMM emission (394.2 and 396.1 eV).…”
Section: Resultsmentioning
confidence: 85%
“…The characteristic peaks of E 2 (low), E 2 (low), and A 1 (LO) belonging to GaN can be detected through a strategy of prolonging the collection time (Figure 4g), implying the bond formation of Ga−N. 27 The characteristic peaks of Ga 2p 1/2 , Ga 2p 3/2 , and Ga 3d centered at 1144.8, 1117.9, and 19.7 eV match well with the standard XPS peaks of GaN, 28 revealing again the successful substitution of the N element to the O element (Figure 4h,i). In Figure 4i, the fitting spectra of N 1s show the obvious contribution of the Ga−N bond (397.5 eV), overlapped with the Auger electron signal originating from Ga LMM emission (394.2 and 396.1 eV).…”
Section: Resultsmentioning
confidence: 85%
“…Moreover, the fitting procedure features several loss peaks due to the inelastic scattering of photoelectrons when they migrate through the 2D flakes . In Figure k, the photoemission spectrum of the N 1s region shows the contribution from the Ga–N (395.86 eV) bond, overlapped with an Auger electron signal originating from the Ga LMM emission …”
Section: Resultsmentioning
confidence: 96%
“…Moreover, the fitting procedure features several loss peaks due to the inelastic scattering of photoelectrons when they migrate through the 2D flakes. 41 In Figure 2k, the photoemission spectrum of the N 1s region shows the contribution from the Ga−N (395.86 eV) bond, overlapped with an Auger electron signal originating from the Ga LMM emission. 41 The GaN flakes with an intact microstructure and a large lateral size allow us to directly prepare electrodes on both ends and measure their photoelectric performance.…”
Section: Resultsmentioning
confidence: 98%
“…8,9 Indeed, several researches have been reported recently on the multi-layered structure which comprised of alternating layer of different inorganic materials with individual layer thickness in nanometer-scale. [10][11][12][13] Furthermore, ultra gas-proof polymer hybrid thin layer with WVRT < 10 À7 g per m 2 per day can be achieved by lling the free volume of the polymer with Al 2 O 3 via gas-phase inltration using ALD method. 14 In order to improve the critical weaknesses of inorganic materials such as cracking and pinhole defects, organic layer can be induced using molecular layer deposition (MLD), which is related to similar self-limiting ALD mechanism.…”
Section: Introductionmentioning
confidence: 99%