Gaining efficiency and resolution in soft X-ray emission spectrometers thanks to directly illuminated CCD detectors

Dinardo, M. E.; Piazzalunga, A.; Braicovich, L.; Bisogni, Valentina; Dallera, C.; Giarda, K.; Marcon, Marco; Tagliaferri, Alberto; Ghiringhelli, G.

doi:10.1016/j.nima.2006.10.024

Cited by 38 publications

(29 citation statements)

References 21 publications

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“…The device presented below has been realized for the AXES spectrometer 15 ; after several refurbishments 16,22 this instrument, based on a variable line-density spherical grating and a CCD detector, has at present a resolving power E/ΔE = 4000-4500 (at 930 eV), corresponding to about 3500 when combined with the beamline monochromator. As shown in Fig.…”

Section: A the Spectrometermentioning

confidence: 99%

The simultaneous measurement of energy and linear polarization of the scattered radiation in resonant inelastic soft x-ray scattering

Braicovich

Minola

Dellea

et al. 2014

Review of Scientific Instruments

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Resonant Inelastic X-ray Scattering (RIXS) in the soft x-ray range is an element-specific energyloss spectroscopy used to probe the electronic and magnetic excitations in strongly correlated solids. In the recent years, RIXS has been progressing very quickly in terms of energy resolution and understanding of the experimental results, but the interpretation of spectra could further improve, sometimes decisively, from a full knowledge of the polarization of incident and scattered photons. Here we present the first implementation, in a high resolution RIXS spectrometer used to analyze the scattered radiation, of a device allowing the measurement of the degree of linear polarization. The system, based on a graded W/B 4 C multilayer mirror installed in proximity of the CCD detector, has been installed on the AXES spectrometer at the ESRF; it has been fully characterized and it has been used for a demonstration experiment at the Cu L 3 edge on a high-Tc superconducting cuprate. The loss in efficiency suffered by the spectrometer equipped with this test facility was a factor 17.5. We propose also a more advanced version, suitable for a routine use on the next generation of RIXS spectrometers and with an overall efficiency up to 10%.

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Section: A the Spectrometermentioning

confidence: 99%

The simultaneous measurement of energy and linear polarization of the scattered radiation in resonant inelastic soft x-ray scattering

Braicovich

Minola

Dellea

et al. 2014

Review of Scientific Instruments

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“…In this time, however, the electrons emanating from the point of interaction produce a larger charge-cloud to be collected under the pixels of the device. In the case of SAXES, amongst other aspects of the studies 16,17 , the CCD spatial resolution determined from this charge spreading was measured to be 24 µm; this spatial resolution directly relates to the spectral resolution achievable with the dispersive spectrometer system. Through the use of photon-counting and centroiding, an improved spatial resolution of below 5 µm has been reported across the energy range of 530 eV to 1000 eV 18 .…”

Section: Super Advanced X-ray Emission Spectrometer (Saxes)mentioning

confidence: 99%

High-resolution soft x-ray spectrometry using the electron-multiplying charge-coupled device (EM-CCD)

et al. 2013

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The Electron-Multiplying Charge-Coupled Device (EM-CCD) shares a similar structure to the CCD except for the inclusion of a gain register that multiplies signal before the addition of read-noise, offering sub-electron effective readnoise at high frame-rates.EM-CCDs were proposed for the dispersive spectrometer on the International X-ray Observatory (IXO) to bring sub-300 eV X-rays above the noise, increasing the science yield. The high-speed, low-noise performance of the EM-CCD brought added advantages of reduced dark current and stray-light per frame, reducing cooling and filtering requirements. To increase grating efficiency, several diffracted spectral orders were co-located so the inherent energy resolution of the detector was required for order separation. Although the spectral resolution of the EM-CCD is degraded by the gain process, it was shown that the EM-CCD could achieve the required separation.The RIXS spectrometer at the Advanced Resonant Spectroscopy beamline (ADRESS) of the Swiss Light Source (SLS) at the Paul Scherrer Institute currently uses a CCD, with charge spreading between pixels limiting the spatial resolution to 24 µm (FWHM). Through improving the spatial resolution below 5 µm alongside upgrading the grating, a factor of two energy resolution improvement could theoretically be made. With the high-speed, low-noise performance of the EM-CCD, photon-counting modes could allow the use of centroiding techniques to improve the resolution. Using various centroiding techniques, a spatial resolution of 2 µm (FWHM) has been achieved experimentally, demonstrating the benefits of this detector technology for soft X-ray spectrometry. This paper summarises the use of EM-CCDs from our first investigations for IXO through to our latest developments in ground-based testing for synchrotron-research and looks beyond to future possibilities.

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“…The spectrometer called SAXES (Super-AXES) replicates the basic optical scheme of the AXES instrument operational at the ESRF since 1994 [3,4], with crucial improvements allowing higher resolution, aberration cancellation, optimal use of the CCD detector, and ideal matching to the beamline optics and performances. It is also twice longer (total sample to detector distance ~5 m instead of ~2.2 m), the maximum compatible with the space available inside the experimental hall.…”

Section: Saxes the High-resolution Soft X-ray Spectrometermentioning

confidence: 99%

High-resolution RIXS with the SAXES Spectrometer at the ADRESS Beamline of the Swiss Light Source

Ghiringhelli

Braicovich

Schmitt

et al. 2012

Synchrotron Radiation News

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Gaining efficiency and resolution in soft X-ray emission spectrometers thanks to directly illuminated CCD detectors

Cited by 38 publications

References 21 publications

The simultaneous measurement of energy and linear polarization of the scattered radiation in resonant inelastic soft x-ray scattering

The simultaneous measurement of energy and linear polarization of the scattered radiation in resonant inelastic soft x-ray scattering

High-resolution soft x-ray spectrometry using the electron-multiplying charge-coupled device (EM-CCD)

High-resolution RIXS with the SAXES Spectrometer at the ADRESS Beamline of the Swiss Light Source

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