2013
DOI: 10.1117/12.2026928
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Gaia basic angle monitoring system

Abstract: The Gaia mission 1 will create an extraordinarily precise three-dimensional map of more than one billion stars in our Galaxy. The Gaia spacecraft 2

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Cited by 12 publications
(9 citation statements)
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“…4.2) and arguably carries the most precise interferometric metrology system ever flown, the basic angle monitor (BAM; e.g. Meijer et al 2009;Gielesen et al 2013;Mora et al 2014b). The BAM is composed of two optical benches fed by a common laser source that introduces two parallel, collimated beams per telescope.…”
Section: Basic Angle Monitormentioning
confidence: 99%
“…4.2) and arguably carries the most precise interferometric metrology system ever flown, the basic angle monitor (BAM; e.g. Meijer et al 2009;Gielesen et al 2013;Mora et al 2014b). The BAM is composed of two optical benches fed by a common laser source that introduces two parallel, collimated beams per telescope.…”
Section: Basic Angle Monitormentioning
confidence: 99%
“…Therefore—since these thermal deformations cannot be eliminated, are difficult to model, and are not predictable in real-time with the requisite precision—the common solution is to have a metrology system to measure changes in the alignment between the various instruments. There are many different designs for such metrology systems, and these have been demonstrated with some success for both ground-based [137,138,139] and space-based [140,141,142] wide-angle astrometry. It is expected that a metrology system will be required to monitor component alignment in any future StarNAV-SA sensor system.…”
Section: Preliminary Feasibility Assessment Of Starnav Measurementsmentioning
confidence: 99%
“…The Basic Angle Monitor (BAM) is one of the key optical sensors of the Gaia payload [4]. The two lines of sight of the two telescopes of the Gaia payload are separated by 106.5˚.…”
Section: Gaia Opticsmentioning
confidence: 99%