2020
DOI: 10.1039/c9nr08453c
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GaAs nanoscale membranes: prospects for seamless integration of III–Vs on silicon

Abstract: Selective area epitaxy of GaAs nanoscale membranes on silicon. Small apertures result in a majority defect-free structures.

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Cited by 13 publications
(15 citation statements)
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“…18 A particular approach corresponds to selective area epitaxy (SAE). [30][31][32][33][34][35][36][37] In SAE, growth is restricted to certain (oen nanoscale) regions of the substrate, which can be dened through e.g. electron beam lithography, nanoimprint lithography or stepper photolithography, with the latter one being compatible with highthroughput manufacturing.…”
mentioning
confidence: 99%
“…18 A particular approach corresponds to selective area epitaxy (SAE). [30][31][32][33][34][35][36][37] In SAE, growth is restricted to certain (oen nanoscale) regions of the substrate, which can be dened through e.g. electron beam lithography, nanoimprint lithography or stepper photolithography, with the latter one being compatible with highthroughput manufacturing.…”
mentioning
confidence: 99%
“…The morphology, sketched in panel (c), looks quite consistent with the trapezoidal ones of Refs. [1,17,18], even if facets are not as sharp. In…”
Section: Resultsmentioning
confidence: 99%
“…In particular, along the six <112> directions (see panel b), vertical nanomembranes are observed, analogous to the ones of Figure 2, despite the shorter spacing. In the six <110> directions, the {110} sidewalls are instead sloped with respect to the virtual substrate plane, so that the fin shape corresponds to a slanted, isosceles trapezoid [1,18], as the one reported in Figure 3c. Due to the 3-fold symmetry of the (111) plane, the side toward which the slanted fins are tilted alternates, as sketched in panel (a).…”
Section: Resultsmentioning
confidence: 99%
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“…4c) [101][102][103], however, the dimensional control with SOI wafer is much better. Many compound semiconducting materials including GaAs [104][105][106][107], GaN [108], and InP [109] have been obtained in a conceptually similar manner to that of Si shown in Fig. 4b-c.…”
Section: Top-down Approachmentioning
confidence: 86%