Ga Ion-doped ZrO2 Catalyst Characterized by XRD, XAFS, and 2-Butanol Decomposition

Yamamoto, Takashi; Kurimoto, Akihito

doi:10.2116/analsci.19sap03

Cited by 10 publications

(3 citation statements)

References 44 publications

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“…In order to further investigate the local electronic structure of different catalysts, X‐ray absorption spectroscopy (XAS) analysis was conducted (Figures S13 and S14, Supporting Information). [ 53 ] According to the X‐ray absorption near‐edge structure (XANES) spectrum presented in Figure 2c, the lowest intensity Pt L III ‐edge white lines in the Pt 3 Ga (Pm

\bar{3}

m) sample indicated that Pt atoms were less oxidized than those in the Pt foil, Pt 3 Ga (P4/mbm) and PtGa alloy. The formation of Pt‐Ga bonds could make absorption edges Pt shifted to higher energy, which meant that the increase of 5d orbital filling relative to Pt foil, explaining the change of XANES spectrum of PtGa samples.…”

Section: Resultsmentioning

confidence: 99%

Symmetry‐Induced Regulation of Pt Strain Derived from Pt₃Ga Intermetallic for Boosting Oxygen Reduction Reaction

Gui,

Cheng,

Wang

et al. 2023

Advanced Materials

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Pt‐based fuel cell catalysts with excellent activity and stability for proton‐exchange membrane fuel cells (PEMFCs) have been developed through strain regulation in recent years. Herein, this work demonstrates that symmetry‐induced strain regulation of Pt surface of PtGa intermetallic compounds can greatly enhance the catalytic performance of the oxygen reduction reaction (ORR). With the strain environment varies derived from the lattice mismatch of analogous PtGa core but different symmetry, the Pt surface of the PtGa alloy and the Pt3Ga (Pmm) precisely realize 0.58% and 2.7% compressive strain compared to the Pt3Ga (P4/mmm). Experimental and theoretical results reveal that when the compressive stress of the Pt lattice increases, the desorption process of O* intermediates becomes accelerated, which is conducive to oxygen reduction. The Pt3Ga (Pmm) with high symmetry and compressive Pt surface exhibit the highest mass and specific activities of 2.18 A mgPt−1 and 5.36 mA cm−2, respectively, which are more than one order of magnitude higher than those of commercial Pt/C catalysts. This work demonstrates that material symmetry can be used to precisely modulate Pt surface stress to enhance the ORR, as well as provide a distinct platform to investigate the relationship between Pt compressibility and catalytic activity.

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\bar{3}

Section: Resultsmentioning

confidence: 99%

Symmetry‐Induced Regulation of Pt Strain Derived from Pt₃Ga Intermetallic for Boosting Oxygen Reduction Reaction

Gui,

Cheng,

Wang

et al. 2023

Advanced Materials

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“…Additionally, no discernible change in lattice spacing was observed when “a” exceeded 0.15, which suggests that there is a limit to the extent of Cu doping (approximately a=0.15). Ga–doped ZrO 2 , [28] Mn–doped ZrO 2 , [29] Zn–doped ZrO 2 , [8b] and Mn–doped CeO 2 [30] have been similarly analyzed.…”

Section: Characterizing Oxide Solid Solutionsmentioning

confidence: 99%

Oxide Solid–Solution Catalysts with Good Redox Properties for Liquid–Phase Aerobic Additive–Free Oxidation: A Review

Tada,

Kondo,

Joutsuka

2024

ChemCatChem

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In this review, we discuss liquid‐phase redox reactions using oxide solid‐solution catalysts. These oxide solid solutions are readily prepared by introducing various elements into the foundational metal oxide template. Doping with metal species leads to the formation of [MOx] clusters with unique coordination structures, which is a remarkable feature that deserves attention. Consequently, oxide solid solutions exhibit catalytic capabilities that extend beyond those of conventional metal‐oxide catalysts. Notably, these [MOx] clusters occasionally exhibit exceptional redox activities that can be used to catalyze liquid‐phase redox reactions. Hence, we conjecture that a connection exists between catalyst structure and activity. This review delves into oxide solid‐solution catalysts through the lenses of organic chemistry, solid catalysts, and computational chemistry, thereby collectively shaping our understanding and prospects in this field.

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“…Recent studies show that Ga 2 O 3 works as a stabilizer for high-temperature phases of zirconia, [32,33] with 3 mol% of Ga 2 O 3 permitting full stabilization of the cubic/tetragonal high-temperature phases. Yamamoto et al also did not distinguish between the cubic and tetragonal phase due to the overlapping of the peaks in XRD analyses of these two phases.…”

Section: Phase Transformation Of Zromentioning

confidence: 99%

Focused Ion Beam Parameters for the Preparation of Oxidic Ceramic Materials

et al. 2020

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The focused ion beam (FIB) technology is a useful tool for structuring and preparing material surfaces on a micrometer and nanometer scale. [1,2] The technology is based on the principle that ions are extracted from an ion source (e.g., a liquid metal ion source, most commonly Ga þ , or gas field ion sources, such as He þ ) by an electric field. [1] Then, they are accelerated toward the substrate surface and focused to form an ion beam by applied electric and magnetic fields. For Ga þ sources, typical acceleration voltages are 5-50 keV and a beam focus <10 nm can be realized. The ion current is usually in the range of tenths of picoamperes to several nanoamperes. [2,3] When the focused ion beam meets the surface of the target material, various interactions between the incident ion beam and target surface occur. [1] First, the incident ions of the beam enter the sample. Due to interactions with the target atoms (nuclei and electrons), the ions are deflected. Second, collisions with target atoms are likely to take place. This may cause a removal of a target atom from its lattice position. Then, the removed target atom can collide with further target atoms, creating collision cascades. Numerous cascades will reach the sample surface, and if provided sufficient energy, will remove atoms from the sample surface. This effect is called sputtering. These processes of ions penetrating and leaving the sample surface are accompanied by the ejection of secondary electrons from the sample surface. Numerous ions that penetrate the surface remain as implanted ions in the target material.These interactions between the FIB and the material surfaces can be brought to several uses for the industrial operator or scientists. 1) Imaging: The ejected secondary electrons and ions from the surface can be used for imaging purposes. [1] 2) Sputtering: This removal of material from the target surface, also called milling, can be used to produce defined samples for further analytical applications (e.g., production of lamellar samples for transmission electron microscopy (TEM) [4,5] ), to structure material surfaces down to the nanometer scale (e.g., structuring of semiconductors [3,6] or samples for mechanical testing on a micrometer scale [7,8] ), and to create serial sections by repeated milling steps for 3D analyses of bulk material. [9] Furthermore, the removed material can be used for elemental analysis of the material surface with the help of secondary ion mass spectrometry (SIMS). [2] 3) Creation of structures: The energy provided by the incident ions can be used to deposit other elements that are provided by precursor molecules. They are introduced via a gas injection system (GIS) on the substrate surface. Due to the energetic input of the ion beam, cracking reactions take place in the precursors and the intended component of the precursor molecules is deposited on the material (e.g., deposition of electrically conductive metallic

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Ga Ion-doped ZrO2 Catalyst Characterized by XRD, XAFS, and 2-Butanol Decomposition

Cited by 10 publications

References 44 publications

Symmetry‐Induced Regulation of Pt Strain Derived from Pt₃Ga Intermetallic for Boosting Oxygen Reduction Reaction

Symmetry‐Induced Regulation of Pt Strain Derived from Pt₃Ga Intermetallic for Boosting Oxygen Reduction Reaction

Oxide Solid–Solution Catalysts with Good Redox Properties for Liquid–Phase Aerobic Additive–Free Oxidation: A Review

Focused Ion Beam Parameters for the Preparation of Oxidic Ceramic Materials

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Ga Ion-doped ZrO2 Catalyst Characterized by XRD, XAFS, and 2-Butanol Decomposition

Cited by 10 publications

References 44 publications

Symmetry‐Induced Regulation of Pt Strain Derived from Pt3Ga Intermetallic for Boosting Oxygen Reduction Reaction

Symmetry‐Induced Regulation of Pt Strain Derived from Pt3Ga Intermetallic for Boosting Oxygen Reduction Reaction

Oxide Solid–Solution Catalysts with Good Redox Properties for Liquid–Phase Aerobic Additive–Free Oxidation: A Review

Focused Ion Beam Parameters for the Preparation of Oxidic Ceramic Materials

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Symmetry‐Induced Regulation of Pt Strain Derived from Pt₃Ga Intermetallic for Boosting Oxygen Reduction Reaction

Symmetry‐Induced Regulation of Pt Strain Derived from Pt₃Ga Intermetallic for Boosting Oxygen Reduction Reaction