FW/M method for determination of the grain size distribution from powder diffraction line profile

Pielaszek, Roman

doi:10.1016/j.jallcom.2004.05.040

Cited by 85 publications

(80 citation statements)

References 8 publications

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“…Grain size distributions (see Fig. 2) in the final products were also determined on the basis of powder diffraction line profile using the Pielaszek method [17].…”

Section: Resultsmentioning

confidence: 99%

Luminescence properties of Cr3+:Y3Al5O12 nanocrystals

Głuchowski

Pązik

Hreniak

et al. 2009

Journal of Luminescence

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“…Grain size distributions (see Fig. 2) in the final products were also determined on the basis of powder diffraction line profile using the Pielaszek method [17].…”

Section: Resultsmentioning

confidence: 99%

Luminescence properties of Cr3+:Y3Al5O12 nanocrystals

Głuchowski

Pązik

Hreniak

et al. 2009

Journal of Luminescence

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“…Further, crystallite size distribution (SD) of this material has also been estimated by FW 1 5 = 4 5 M method [40]. A detailed description and justification of the FW1/5 and 4/5M method can be found elsewhere [41].…”

Section: Structural Analysismentioning

confidence: 99%

Synthesis, characterization, magnetic properties and gas sensing applications of ZnxCu1−xFe2O4 (0.0≤x≤0.8) nanocomposites

Singh¹,

Singh²,

Joshi³

et al. 2014

Materials Science in Semiconductor Processing

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“…The main defect types or microstructural properties of which LPA can provide information are the (i) average crystallite size and (ii) size distribution, cf. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20], (iii) average dislocation density and (iv) dislocation character, cf. [21][22][23][24][25][26][27][28][29][30][31][32] (v) slip activity, (vi) active Burgers vectors, cf.…”

Section: à2mentioning

confidence: 99%

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Gubicza

Ungár

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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Abstract. X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials.

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FW/M method for determination of the grain size distribution from powder diffraction line profile

Cited by 85 publications

References 8 publications

Luminescence properties of Cr3+:Y3Al5O12 nanocrystals

Luminescence properties of Cr3+:Y3Al5O12 nanocrystals

Synthesis, characterization, magnetic properties and gas sensing applications of ZnxCu1−xFe2O4 (0.0≤x≤0.8) nanocomposites

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

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