Fundamental Materials Research and Advanced Process Development for Thin-Film CIS-Based Photovoltaics: Final Technical Report, 2 October 2001 - 30 September 2005
“…This indicated that the poor device performance could be due to the laser pulse also causing damage in the CIGSe/CdS interface region. Increasing the pulse number to 10 or 20 pulses 93 also showed similar improvements in Hall mobility. However, device measurements revealed that only the lowest laser fluence (30 mJ cm −2 ) led to an efficiency increase over the 9.1% efficient reference device.…”
Section: Pulsed Laser Annealingmentioning
confidence: 64%
“…The first published studies of sub-melt PLA of CISe were carried out by the group of Anderson, [93][94][95] which used co-evaporated CuðIn; GaÞSe 2 absorbers as pictured in Fig. 7b(i) with a CdS buffer layer deposited on the surface.…”
“…This indicated that the poor device performance could be due to the laser pulse also causing damage in the CIGSe/CdS interface region. Increasing the pulse number to 10 or 20 pulses 93 also showed similar improvements in Hall mobility. However, device measurements revealed that only the lowest laser fluence (30 mJ cm −2 ) led to an efficiency increase over the 9.1% efficient reference device.…”
Section: Pulsed Laser Annealingmentioning
confidence: 64%
“…The first published studies of sub-melt PLA of CISe were carried out by the group of Anderson, [93][94][95] which used co-evaporated CuðIn; GaÞSe 2 absorbers as pictured in Fig. 7b(i) with a CdS buffer layer deposited on the surface.…”
“…We consider that the reaction of these binary or elemental phases is thermodynamically favoured and leads to an improved recrystallization during annealing and therefore results in larger crystals. The approach of forming CuInSe 2 by annealing binary selenides has also followed by Anderson and coworkers (5)(6)(7)(8). They grow InSe/CuSe and In 2 Se 3 /CuSe stacks by migration enhanced epitaxy and perform insitu XRD measurements to study the reaction path.…”
CuInSe2 (CIS) thin films were successfully formed by annealing of electrodeposited In2Se3/CuxSey and In2Se3/Cu stacks. Conditions for the uniform and stoichiometric electrodeposition of In2Se3, Cu, and CuxSey thin layers are presented. Phase evolution during the annealing is studied by XRD for several temperatures. SEM cross sections show recrystallization during annealing for the copper selenide containing precursor. The photoelectrochemical response of the absorber is weaker compared to coelectrodeposited CIS and requires further improvement.
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