Functions for Quality Transition Fault Tests

Michael, M.K.; Neophytou, Stelios; Tragoudas, Spyros

doi:10.1109/isqed.2005.60

Cited by 2 publications

(8 citation statements)

References 12 publications

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“…In this Section we show how the method of [7] can be applied to restrict event activation/propagation through a subcircuit that contains paths that meet predetermined delay criteria under the fixed gate delay model. In this manner, specific sensitization criteria as well as path criticality can be considered for high quality test generation.…”

Section: Testing Faults Through Paths Of Specific Lengthmentioning

confidence: 99%

“…The recent work in [7] shows how to generate a function that contains all possible tests to detect a transition fault, and presents a systematic methodology to derive the functions for all transition faults based on only two circuit traversals. For a rising (falling) transition fault, denoted by f , we refer to the corresponding function as the rising (falling) test function, denoted by T R f () (T F f ()).…”

Section: Introductionmentioning

confidence: 99%

“…For a rising (falling) transition fault, denoted by f , we refer to the corresponding function as the rising (falling) test function, denoted by T R f () (T F f ()). Moreover, [7] shows how the functions can be parameterized using sensitization criteria for quality event activation and propagation, as those that have been adopted in PDF test generation. The robust, non-robust, and functional sensitization criteria of [3] were explicitly discussed in [7], however, any other sensitization classification rules that have been proposed in the literature can be incorporated.…”

Section: Introductionmentioning

confidence: 99%

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Test set enhancement for quality transition faults using function-based methods

Neophytou

Michael

Tragoudas³

2005

Proceedings of the 15th ACM Great Lakes Symposium on VLSI

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1 A recent method generates high quality tests for transition faults using functions. Event sensitization criteria as well as path lengths can be taken into consideration during the generation of such test functions. It is shown how to manipulate the test functions to generate compact test sets. Experimental results on ISCAS'85 and ISCAS'89 circuits show that a compaction rate of the order of 70% to 84% is achieved without compromising fault coverage. Moreover, a novel method to enrich the compacted test set with additional vectors is presented so that transition faults are tested through different activation and propagation paths. Such test sets have higher quality, compared to traditional transition fault test sets, since events propagate through many critical paths.

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Section: Testing Faults Through Paths Of Specific Lengthmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Test set enhancement for quality transition faults using function-based methods

Neophytou

Michael

Tragoudas³

2005

Proceedings of the 15th ACM Great Lakes Symposium on VLSI

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“…f pv @i = f av @i · ∀j∈Op (f ap1m @j + f ap0m @j) (6) f pv @i is given by Equation 6. The disjunction( ) ensures that the TF at i could propagate to any output as either a marked rising or falling transition.…”

Section: Definitionmentioning

confidence: 99%

“…Tests for TFs that are on short paths are unnecessary but traditional ATPGs for TFs have no means for avoiding such tests. Previously proposed methods like [2,6,7] either do not guarantee detection of small delay defects as they propagate events along short paths or enumerate the long paths which can be very time consuming.…”

Section: Introductionmentioning

confidence: 99%

Quality transition fault tests suitable for small delay defects

Kumar

Tragoudas

2005 International Conference on Computer Design

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Compact high quality test sets to detect small delay defects can be generated using the transition fault model by insisting that events are activated and propagated only along the critical paths for each transition fault, implicitly kept in a zero-suppressed binary decision diagram. This paper shows how to implicitly generate test functions for the described high quality transition fault model. The novelty of the method relies on a multivalued algebra that is used to generate the test functions with a single circuit traversal.

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Functions for Quality Transition Fault Tests

Cited by 2 publications

References 12 publications

Test set enhancement for quality transition faults using function-based methods

Test set enhancement for quality transition faults using function-based methods

Quality transition fault tests suitable for small delay defects

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