DOI: 10.3990/1.9789036540339
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Functional scanning probes for sensing, actuation and deposition

Abstract: The imaging of objects by standard bright field microscopy is limited by the wavelength of light. An advanced high resolution microscopy technique, based on a relatively simple principle, is atomic force microscopy (AFM). In this technique the topography of a surface is mapped by measuring the force acting on an extremely sharp tip when it is scanned over a surface of interest. Nanoscale resolution can be obtained with AFM, which makes it an indispensable tool for nanotechnology. Next to imaging, even more exc… Show more

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