Functional Pattern-Related Anomaly Detection Approach Collaborating Binary Segmentation with Finite State Machine
Ming Wan,
Minglei Hao,
Jiawei Li
et al.
Abstract:The process control-oriented threat, which can exploit OT (Operational Technology) vulnerabilities to forcibly insert abnormal control commands or status information, has become one of the most devastating cyber attacks in industrial automation control. To effectively detect this threat, this paper proposes one functional patternrelated anomaly detection approach, which skillfully collaborates the BinSeg (Binary Segmentation) algorithm with FSM (Finite State Machine) to identify anomalies between measuring dat… Show more
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