Fully-Coupled Simulation of the Temperature Effect on Negative Capacitance Ferroelectric Devices

Raol, Abhishek; Jiao, Tom; Shashidhara, Chandana; Wong, Hiu Yung

doi:10.1109/laedc51812.2021.9437945

2021 IEEE Latin America Electron Devices Conference (LAEDC) 2021

DOI: 10.1109/laedc51812.2021.9437945

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Fully-Coupled Simulation of the Temperature Effect on Negative Capacitance Ferroelectric Devices

Abhishek Raol

Tom Jiao

Chandana Shashidhara

et al.

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Fully-Coupled Simulation of the Temperature Effect on Negative Capacitance Ferroelectric Devices

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References 15 publications

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