2008
DOI: 10.1093/ietele/e91-c.1.105
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Fullband Simulation of Nano-Scale MOSFETs Based on a Non-equilibrium Green's Function Method

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Cited by 5 publications
(3 citation statements)
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“…On the other hand, the on-currents at higher V G conditions are almost the same for both approaches because thermal injection is a dominant carrier injection process at the on-state. Furthermore, the subthreshold swings (SS) are calculated to compare with those from ballistic NEGF method (29,30) as shown in Fig. 11.…”
Section: Si Nanowire Transistorsmentioning
confidence: 99%
“…On the other hand, the on-currents at higher V G conditions are almost the same for both approaches because thermal injection is a dominant carrier injection process at the on-state. Furthermore, the subthreshold swings (SS) are calculated to compare with those from ballistic NEGF method (29,30) as shown in Fig. 11.…”
Section: Si Nanowire Transistorsmentioning
confidence: 99%
“…Therefore it is important to reduce the computational time required for NEGF device simulations; for instance, by applying information-scientific viewpoint [11,12,13,14]. As a representative example, consider double-gate MOSFET (DG-MOSFET) [15,16,17,18,19,20,21]. The precise two-dimensional distribution pattern of the electrostatic potential and the carrier density in the x-z plane (see Fig.…”
Section: Introductionmentioning
confidence: 99%
“…In a quantum transport regime, not only the device geometric shape, but also the electron's wave or particle natures directly appear on the device characteristics. So, quantum-corrected Monte Carlo (MC) method [2,3], Wigner function model [4] and non-equilibrium Green's function (NEGF) method [5] are widely used. Further scaling down into atomistic regime requires new challenges to establish more elaborate quantum mechanical model based on the first-principles theory.…”
mentioning
confidence: 99%