2013
DOI: 10.1016/j.microrel.2012.10.015
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FSI implications of EMC rheological properties to 3D IC with TSV structures during plastic encapsulation process

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Cited by 8 publications
(6 citation statements)
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“…Higher viscosity will cause higher pressure and viscous in molding process. Ong et al, [45] studied the implication of rheological behavior of EMC towards 3D IC packaging. The EMC rheological characteristic posed significant impact and fluid flow behavior during plastic encapsulation process.…”
Section: Characterization Of Encapsulating Materials For Led and Elec...mentioning
confidence: 99%
“…Higher viscosity will cause higher pressure and viscous in molding process. Ong et al, [45] studied the implication of rheological behavior of EMC towards 3D IC packaging. The EMC rheological characteristic posed significant impact and fluid flow behavior during plastic encapsulation process.…”
Section: Characterization Of Encapsulating Materials For Led and Elec...mentioning
confidence: 99%
“…where u, v, and w are the velocity vectors in the x, y, and z directions, respectively. The momentum conservation equation for 3D Newtonian fluids is expressed as (Ong et. al 2012b):…”
Section: Governing Equationsmentioning
confidence: 99%
“…The material and thermal properties are summarized in Tables I and II, respectively. No slip condition was set for all structural surfaces (Ong et al, 2013). Therefore, the tangential velocity component was zero relative to the component surface.…”
Section: Structural Modelingmentioning
confidence: 99%