Frontiers ofin situelectron microscopy

Abstract

In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the ability to correlate a material's structure and properties. With the recent advances in instrumentation, including aberration-corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is provided. The article also introduces the six articles in this issue of MRS Bulletin exploring the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, studies on nanomechanics and ferroelectric domain switching, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects. ABSTRACT SUBMISSION ENDS JANUARY 30, 2015 SAVE THE DATEThe 57 th Electronic Materials Conference (EMC 2015) is the premier annual forum on the preparation and characterization of electronic materials. Held June 24-26 at The Ohio State University, this year's Conference will feature a plenary session, parallel topical sessions, a poster session and an industrial exhibition. Mark your calendar today and plan to attend!

Complexion time-temperature-transformation (TTT) diagrams: Opportunities and challenges

“…Aberration correction has been accessible for the past 15 years and, as a result, internal interfaces are now observed on the atomic scale [28]. Furthermore, with recent improvements in in-situ capabilities [29] it is now possible to observe grain-boundary phenomena (e.g. grain growth) in real time at elevated temperatures.…”

A Review of Transmission Electron Microscopy of Quasicrystals—How Are Atoms Arranged?

“…The observation of structural changes caused by phase transformation, electron irradiation, chemical reaction, catalysis, hydrogen storage and indentation etc. will be realized [107]. It will be even possible to observe the real-time changes of atomic arrangement under various conditions.…”

Achieve atomic resolution in in situ S/TEM experiments to examine complex interface structures in nanomaterials

“…reviewed here [43,181]) is, however, extremely demanding. We desire to maintain the state-of-the art microscope performance and overall stability to avoid compromising the high resolution imaging and analytical capabilities we just have seen in Section 2.…”