2018
DOI: 10.1017/s1431927618015015
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From Light Microscopy to Analytical Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB)/SEM in Biology: Fixed Coordinates, Flat Embedding, Absolute References

Abstract: Correlative light and electron microscopy (CLEM) has been in use for several years, however it has remained a costly method with difficult sample preparation. Here, we report a series of technical improvements developed for precise and cost-effective correlative light and scanning electron microscopy (SEM) and focused ion beam (FIB)/SEM microscopy of single cells, as well as large tissue sections. Customized coordinate systems for both slides and coverslips were established for thin and ultra-thin embedding of… Show more

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Cited by 29 publications
(21 citation statements)
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References 44 publications
(56 reference statements)
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“…Cells were seeded on laser marked slides 69 . For light microscopic investigations cells were fixed in cacodylate buffer and stained with DAPI, as described by Luckner and Wanner 69 .…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations
“…Cells were seeded on laser marked slides 69 . For light microscopic investigations cells were fixed in cacodylate buffer and stained with DAPI, as described by Luckner and Wanner 69 .…”
Section: Methodsmentioning
confidence: 99%
“…Cells were seeded on laser marked slides 69 . For light microscopic investigations cells were fixed in cacodylate buffer and stained with DAPI, as described by Luckner and Wanner 69 . From each passage 10 representative interphase cells were selected in phase contrast light microscopy according to their cell size and shape and documented with a CCD camera with the corresponding epifluorescence DAPI image.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…FIB-SEM has the great advantage over SBF-SEM to be applicable on archive material conventionally embedded for TEM, as high-contrast achieving protocols like rOTO (see above) are not required (Hegermann et al 2019 ; Steyer et al 2020 ; Wrede et al 2020 ). Similar to SBF-SEM, however, the resin block surface is made conductive by coating it with metals and carbon (Luckner and Wanner 2018 ; Wrede et al 2020 ), but while in SBF-SEM this coat is removed by the diamond knife, in a FIB-SEM, the resin block stays coated and only the small FOV of a few hundred µm 2 is unsealed by the FIB. In this way, charging effects are minimized, making imaging much more feasible compared to SBF-SEM.…”
Section: Focused Ion Beam Scanning Electron Microscopy (Fib-sem)mentioning
confidence: 99%