2022
DOI: 10.1007/s00339-022-05827-z
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Frequency–temperature-dependent electrical properties of fabricated (Pb0.7Bi0.15Sm0.15)(Ti0.7Fe0.3)O3 capacitive electronic material component

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Cited by 5 publications
(1 citation statement)
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“…The resistivity properties of a dielectric material can be determined from the complex impedance spectroscopic analysis. , Figure shows the variations of the real part ( Z ′ = Z cosθ) and imaginary part ( Z ″ = Z sinθ) of complex impedance ( Z *) as a function of frequency at different temperatures, where Z and θ can be attributed to the magnitude of complex impedance and phase factor. The values of Z ′ and Z ″ behave in a similar manner.…”
Section: Resultsmentioning
confidence: 99%
“…The resistivity properties of a dielectric material can be determined from the complex impedance spectroscopic analysis. , Figure shows the variations of the real part ( Z ′ = Z cosθ) and imaginary part ( Z ″ = Z sinθ) of complex impedance ( Z *) as a function of frequency at different temperatures, where Z and θ can be attributed to the magnitude of complex impedance and phase factor. The values of Z ′ and Z ″ behave in a similar manner.…”
Section: Resultsmentioning
confidence: 99%