We present an interferometric technique based on differential interferometry setup for measurement in the subnanometer scale in atmospheric conditions. One of the important limiting factors in any optical measurement are fluctuations of the refractive index of air representing a source of uncertainty traditionally compensated when the index is evaluated indirectly from the physical parameters of the atmosphere. Our proposal is based on the concept of overdetermined interferometric setup where a reference length is derived from a mechanical frame made from a material with very low thermal coefficient on the 10 -8 level. The technique allows to track the variations of the refractive index of air on-line directly in the line of the measuring beam and to compensate for the fluctuations.
Stabilization of WavelengthProposed concept relies on direct stabilization of wavelength to a mechanical reference. The principal optical arrangement [1] consists of a set of two countermeasuring interferometers. The moving element, representing the displacement to be measured, moves within stable grid of fringes/wavelengths insensitive to the varying refractive index of air. The key improvement here is the ability to measure, or compensate, for the refractive index variations in the beam path identical with the position sensing. Concepts proposing referencing wavelength to external mechanical reference have been proposed before [2] but thermal gradients and inhomogeneity of the atmosphere results in a large uncertainty caused by measurement of the refractive index of air at a place different to the measuring beam. In this contribution we present a new version of this concept focused on a design applicable in real displacement measurements. The setup consists of three interferometers where each measures the specified part of the overall length (A, B, C, see Fig. 1).