Frequency Dependence of Measured MOSFET Distortion Characteristic

Minami, Tsubasa; Takeda, Yutaka; Miyake, Masao; Miura-Mattausch, M.; Mattausch, H. J.; Ohguro, T.; Iizuka, T.; Taguchi, Makoto; Miyamoto, S.

doi:10.7567/ssdm.2007.b-10-5

Extended Abstracts of the 2007 International Conference on Solid State Devices and Materials 2007

DOI: 10.7567/ssdm.2007.b-10-5

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Frequency Dependence of Measured MOSFET Distortion Characteristic

Tsubasa Minami¹,

Yutaka Takeda²,

Masao Miyake³

et al.

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Frequency Dependence of Measured MOSFET Distortion Characteristic

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