1995
DOI: 10.4028/www.scientific.net/msf.196-201.23
|View full text |Cite
|
Sign up to set email alerts
|

Free Electrons and Resonant Donor State in Gallium Nitride

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2020
2020
2020
2020

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…The NID region with a dopant concentration of 1.5 x 10 19 cm -3 can also be identified. Above and below the Mg doped layers, a bright contrast due to the residual n-type doping which is estimated to be 1x10 17 cm -3 can be observed [27]. Figure 3(b) shows the Vdopant profile that was extracted directly from the region indicated in figure 3(a).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The NID region with a dopant concentration of 1.5 x 10 19 cm -3 can also be identified. Above and below the Mg doped layers, a bright contrast due to the residual n-type doping which is estimated to be 1x10 17 cm -3 can be observed [27]. Figure 3(b) shows the Vdopant profile that was extracted directly from the region indicated in figure 3(a).…”
Section: Resultsmentioning
confidence: 99%
“…To obtain a more quantitative measurement of the active dopants in the layers, the 2D electrostatic potential in the 500 nm thick TEM lamella was simulated using the Nextnano 3 software [28]. As well as the differently doped layers with their corresponding thicknesses, a residual n-type activity with an electron concentration of 1 x 10 17 cm -3 was used in the whole structure [27]. Moreover, the presence of charged surfaces resulting from the presence of damaged surface layers and their interaction with the electron beam was included.…”
Section: Resultsmentioning
confidence: 99%