Free charge carrier absorption in silicon at 800 nm

Heisel, P. C.; Ndebeka, Wilfrid Innocent; Neethling, Pieter; Paa, W.; Rohwer, Erich G.; Steenkamp, Christine M.; Stafast, H.

doi:10.1007/s00340-015-6308-5

Cited by 6 publications

(1 citation statement)

References 29 publications

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“…In addition, we ignore non-linear light absorptions such as two-photon and free-carrier absorptions in this model since these effects are weak and do not affect the calculation results under the present fluence of 1 mJ/cm 2 . 27 By solving Eqs. (1)–(4) using the finite-element method, we investigated carrier-strain dynamics in silicon plates.…”

Section: Methodsmentioning

confidence: 99%

Finite-element simulation of photoinduced strain dynamics in silicon thin plates

Nakamura

Shimojima

Ishizaka

2021

Structural Dynamics

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In this paper, we investigate the femtosecond-optical-pulse-induced strain dynamics in relatively thin (100 nm) and thick (10 000 nm) silicon plates based on finite-element simulations. In the thin sample, almost spatially homogeneous excitation by the optical pulse predominantly generates a standing wave of the lowest-order acoustic resonance mode along the out-of-plane direction. At the same time, laterally propagating plate waves are emitted at the sample edge through the open edge deformation. Fourier transformation analysis reveals that the plate waves in the thin sample are mainly composed of two symmetric Lamb waves, reflecting the spatially uniform photoexcitation. In the thick sample, on the other hand, only the near surface region is photo-excited and thus a strain pulse that propagates along the out-of-plane direction is generated, accompanying the laterally propagating pulse-like strain dynamics through the edge deformation. These lateral strain pulses consist of multiple Lamb waves, including asymmetric and higher-order symmetric modes. Our simulations quantitatively demonstrate the out-of-plane and in-plane photoinduced strain dynamics in realistic silicon plates, ranging from the plate wave form to pulse trains, depending on material parameters such as sample thickness, optical penetration depth, and sound velocity.

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Section: Methodsmentioning

confidence: 99%