2009
DOI: 10.1063/1.3068172
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Free carrier dynamics of InN nanorods investigated by time-resolved terahertz spectroscopy

Abstract: Ultrafast time-resolved terahertz spectroscopy is employed to investigate the carrier dynamics of indium nitride ͑InN͒ nanorod arrays and an epitaxial film. Transient differential transmission of terahertz wave shows that hot carrier cooling and defect-related nonradiative recombination are the common carrier relaxation processes for InN film and nanorods. However, the electrons confined in the narrow structure of nanorods are significantly affected by the carrier diffusion process near the surface, which caus… Show more

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Cited by 7 publications
(4 citation statements)
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“…Evidently, biexponential decay behaviors of the samples represent two characteristic recombination channels involved in the recombination process. Combining previous studies 38,40 and analysis below, the fast decay is mainly attributed to rapid photocarrier capture by the surface traps, and the slow decay is mainly ascribed to nonradiative structural-defect-related recombination. The characteristic time τ 1 of fast decay for CdS nanobelts is measured as 21.4 ps; the value is consistent with that of 28 ps for CdS nanoparticles investigated by the optical-pump IR-probe technique.…”
supporting
confidence: 62%
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“…Evidently, biexponential decay behaviors of the samples represent two characteristic recombination channels involved in the recombination process. Combining previous studies 38,40 and analysis below, the fast decay is mainly attributed to rapid photocarrier capture by the surface traps, and the slow decay is mainly ascribed to nonradiative structural-defect-related recombination. The characteristic time τ 1 of fast decay for CdS nanobelts is measured as 21.4 ps; the value is consistent with that of 28 ps for CdS nanoparticles investigated by the optical-pump IR-probe technique.…”
supporting
confidence: 62%
“…On the other hand, revealed in parts a and b of Figure 4, the slow process does not show observable excitation intensity dependence, suggesting that the carrier recombination is mainly due to structural-defect-related nonradiative recombination and/or band-to-band recombination. 40 In this work, the origin of structural defects is attributed to the compositional disorder in ternary compound. The characteristic lifetime of slow process is 1000 ps for CdS nanobelts, while it is 894 ps for CdS 0.65 Se 0.35 nanobelts.…”
mentioning
confidence: 99%
“…The carrier densities in NRs were separately estimated from the timedomain THz spectroscopy experiment and were found to be about one order of magnitude higher than that of the InN epilayer. 15) The temperature-dependent PL peak energy of the InN epilayer in Fig. 2 exhibits an S-shape dependence and gradually redshifts with a further increase of temperature, following the temperature dependence described by Varshni's equation.…”
mentioning
confidence: 64%
“…The dominant contribution of the BF effect to reflectivity is also observed for InN nanorod arrays which are grown at sample temperature of 520˚C on Si(111). 18,19 InN nanorod arrays consisted of nanorods of the diameter of 60 and 130 nm have higher background carrier density (~10 19 cm -3 ) than InN films which exceeds the density of photoexcited carriers at the current pump fluence 20 experience the strong BF effect and the transient reflectivity sharply increases as soon as the pump pulses arrive. The details of the carrier dynamics of InN nanostructure arrays will be discussed in the future publication.…”
Section: Ultrafast Optical Pump-and-probe Experimentsmentioning
confidence: 99%